by PARK, Kye-Sung, SATO, Wakao, GRAUSE, Guido, KAMEDA, Tomohito, YOSHIOKA, Toshiaki
Published in Thermochimica acta (10.09.2009)

by Choi, Woo Young, Kwon, Hyug Su, Kim, Yong Jun, Lee, Byungin, Yoo, Hyunseung, Choi, Sangmoo, Cho, Gyu-Seog, Park, Sung-Kye
Published in IEEE electron device letters (01.02.2017)

by Kwon, Dae Woong, Kim, Wandong, Kim, Do-Bin, Lee, Sang-Ho, Seo, Joo Yun, Baek, Myung-Hyun, Park, Ji-Ho, Choi, Eunseok, Cho, Gyu Seong, Park, Sung-Kye, Lee, Jong-Ho, Park, Byung-Gook
Published in IEEE transactions on electron devices (01.03.2016)

by Kwon, Dae Woong, Kim, Wandong, Kim, Do-Bin, Lee, Sang-Ho, Seo, Joo Yun, Baek, Myung Hyun, Park, Ji-Ho, Choi, Eunseok, Cho, Gyu Seong, Park, Sung-Kye, Park, Byung-Gook
Published in IEEE electron device letters (01.12.2015)

by Moon-Sik Seo, Bong-Hoon Lee, Sung-Kye Park, Endoh, Tetsuo
Published in IEEE transactions on electron devices (01.08.2012)

by Kwon, Dae Woong, Kim, Wandong, Kim, Do-Bin, Lee, Sang-Ho, Seo, Joo Yun, Choi, Eunseok, Cho, Gyu Seog, Park, Sung-Kye, Lee, Jong-Ho, Park, Byung-Gook
Published in IEEE transactions on electron devices (01.09.2016)

by Moon-Sik Seo, Sung-Kye Park, Endoh, Tetsuo
Published in IEEE transactions on electron devices (01.09.2011)

by Kwon, Dae Woong, Seo, Joo Yun, Park, Se Hwan, Kim, Wandong, Kim, Do-Bin, Lee, Sang-Ho, Cho, Gyu Seong, Park, Sung-Kye, Park, Byung-Gook
Published in IEEE electron device letters (01.11.2016)

by JOE, Sung-Min, YI, Jeong-Hyong, PARK, Sung-Kye, SHIN, Hyungcheol, PARK, Byung-Gook, YOUNG JUNE PARK, LEE, Jong-Ho
Published in IEEE transactions on electron devices (01.01.2011)

by Kang, Ho-Jung, Choi, Nagyong, Joe, Sung-Min, Seo, Ji-Hyun, Choi, Eunseok, Park, Sung-Kye, Park, Byung-Gook, Lee, Jong-Ho
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by JOE, Sung-Min, JEONG, Min-Kyu, JO, Bong-Su, HAN, Kyoung-Rok, PARK, Sung-Kye, LEE, Jong-Ho
Published in IEEE transactions on electron devices (01.12.2012)

by Joe, Sung-Min, Yi, Jeong-Hyong, Park, Sung-Kye, Kwon, Hyuck-In, Lee, Jong-Ho
Published in IEEE electron device letters (01.07.2010)

by Kim, Yong Jun, Kang, Jun Geun, Lee, Byungin, Cho, Gyu-Seog, Park, Sung-Kye, Choi, Woo Young
Published in Japanese Journal of Applied Physics (01.04.2014)

by JOE, Sung-Min, JEONG, Min-Kyu, KANG, Myounggon, HAN, Kyoung-Rok, PARK, Sung-Kye, LEE, Jong-Ho
Published in IEEE electron device letters (01.08.2012)

by LEE, Ga-Won, LEE, Hi-Duck, LIM, Kwan-Yong, YONG SOO KIM, YANG, Hong-Sun, CHO, Gyu-Seog, PARK, Sung-Kye, HONG, Sung-Joo
Published in IEEE electron device letters (01.02.2009)

by Jeong-Hyong Yi, Sung-Kye Park, Park, Y.-J., Hong Shick Min
Published in IEEE transactions on electron devices (01.04.2005)

by You, Hae Sung, Yook, Yeong Geun, Chang, Won Seok, Park, Jae Hyeong, Oh, Min Ju, Kwon, Deuk Chul, Yoon, Jung Sik, Yu, Dong Hun, Kwon, Hyoung Chul, Park, Sung-Kye, Im, Yeon Ho
Published in Journal of physics. D, Applied physics (16.09.2020)

by Tae-Un Youn, Keum-Whan Noh, Sang-Mok Yi, Jong-Wook Kim, Noh-Yong Park, Sung-Chul Shin, Kwang-Hyun Yun, Byung-Kook Kim, Sung-Kye Park, Seok-Kiu Lee, Sung-Joo Hong
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by Eun-Seok Choi, Sung-Kye Park
Published in 2012 International Electron Devices Meeting (01.12.2012)

by Lee, Keun Woo, Kim, Kyung Min, Heo, Kon Yi, Park, Sung Kye, Lee, Seok Kiu, Kim, Hyun Jae
Published in Current applied physics (01.05.2011)