Microstructural Analysis of Ti/Ni Bilayer Ohmic Contacts on 4H-SiC Layers
Kranz, Lukas, Sundaramoorthy, Vinoth, Alfieri, Giovanni
Published in Materials science forum (19.07.2019)
Published in Materials science forum (19.07.2019)
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Journal Article
Formation of Ohmic Contacts to n-Type 4H-SiC at Low Annealing Temperatures
Knoll, Lars, Sundaramoorthy, Vinoth, Kranz, Lukas, Minamisawa, Renato Amaral, Alfieri, Giovanni
Published in Materials science forum (05.06.2018)
Published in Materials science forum (05.06.2018)
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Journal Article
Investigation of Ti/Ni Bilayer Contacts to n-Type 4H-SiC
Song, Yu Lun, Sundaramoorthy, Vinoth Kumar, Minamisawa, Renato Amaral
Published in Materials science forum (30.06.2015)
Published in Materials science forum (30.06.2015)
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Journal Article
The Effects of Illumination on Point Defects Detected in High Purity Semi-Insulating 4H-SiC
Kranz, Lukas, Sundaramoorthy, Vinoth, Knoll, Lars, Alfieri, Giovanni
Published in Materials science forum (05.06.2018)
Published in Materials science forum (05.06.2018)
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Journal Article
A study to improve IGBT reliability in power electronics applications
Sundaramoorthy, Vinoth Kumar, Bianda, Enea, Riedel, Gernot Jurgen
Published in 2015 International Semiconductor Conference (CAS) (01.10.2015)
Published in 2015 International Semiconductor Conference (CAS) (01.10.2015)
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Conference Proceeding
Journal Article
On the influence of active area design on the performance of SiC JBS diodes
Mihaila, A., Minamisawa, R. A., Knoll, L., Sundaramoorthy, V. K., Bianda, E., Bartolf, H., Alfieri, G., Rahimo, M.
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
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Conference Proceeding
Journal Article