Failure analysis on the standby current due to dislocation in STI structure of flash memory
Sang In Kim, Hyung Mo Yang, Hee Seong Yang, Ju Hyeon Ahn, Seok Sik Kim, Yu Gyun Shin, Ki Hyun Hwang, Ji Woon Rim, Woon Kyung Lee, Han Soo Kim, Sun Kyu Whang, Ji Woong Sue, Han Ku Cho
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
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