Exploring High-Temperature Reliability of 4H-SiC MOSFETs : A Comparative Study of High-K Gate Dielectric Materials
M. V. Ganeswara Rao, N. Ramanjaneyulu, Sumalatha Madugula, N. P. Dharani, K. Rajesh Babu, Kallepelli Sagar
Published in Transactions on electrical and electronic materials (01.04.2024)
Published in Transactions on electrical and electronic materials (01.04.2024)
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Journal Article
RETRACTED ARTICLE: Exploring High-Temperature Reliability of 4H-SiC MOSFETs: A Comparative Study of High-K Gate Dielectric Materials
Ganeswara Rao, M. V., Ramanjaneyulu, N., Madugula, Sumalatha, Dharani, N. P., Rajesh Babu, K., Sagar, Kallepelli
Published in Transactions on electrical and electronic materials (01.04.2024)
Published in Transactions on electrical and electronic materials (01.04.2024)
Get full text
Journal Article
Retraction Note: Exploring High-Temperature Reliability of 4H-SiC MOSFETs: A Comparative Study of High-K Gate Dielectric Materials
Ganeswara Rao, M. V., Ramanjaneyulu, N., Madugula, Sumalatha, Dharani, N. P., Rajesh Babu, K., Sagar, Kallepelli
Published in Transactions on electrical and electronic materials (01.10.2024)
Published in Transactions on electrical and electronic materials (01.10.2024)
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Journal Article
Figures of Merit in High Frequency GaN-Based Parallel Split Gate Trench Power MOSFET Device
Jaiswal, Nilesh Kumar, Krishna, K. Hari, Ganeswara Rao, M. V., Murali, Anumothu, Madugula, Sumalatha, Shubham
Published in 2024 IEEE Third International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES) (26.04.2024)
Published in 2024 IEEE Third International Conference on Power Electronics, Intelligent Control and Energy Systems (ICPEICES) (26.04.2024)
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Conference Proceeding
Efficient Data Comparison through Multiplexer Logic for Low Power and Low Area
Madugula, Sumalatha, Ganeswara Rao, M. V., Pattapu, Aruna Kumari, Odugu, Swathi Siddeswari, Mallidi, Lakshmi Kalyani Rekha, Muttha, Priyanka
Published in 2024 OPJU International Technology Conference (OTCON) on Smart Computing for Innovation and Advancement in Industry 4.0 (05.06.2024)
Published in 2024 OPJU International Technology Conference (OTCON) on Smart Computing for Innovation and Advancement in Industry 4.0 (05.06.2024)
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Conference Proceeding