Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids
Martínez, N F, Lozano, J R, Herruzo, E T, Garcia, F, Richter, C, Sulzbach, T, Garcia, R
Published in Nanotechnology (24.09.2008)
Published in Nanotechnology (24.09.2008)
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Journal Article
Influence of the cantilever holder on the vibrations of AFM cantilevers
Rabe, U, Hirsekorn, S, Reinstädtler, M, Sulzbach, T, Lehrer, Ch, Arnold, W
Published in Nanotechnology (31.01.2007)
Published in Nanotechnology (31.01.2007)
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Journal Article
Cantilever probes for high speed AFM
Richter, C., Weinzierl, P., Engl, W., Penzkofer, C., Irmer, B., Sulzbach, T.
Published in Microsystem technologies (01.08.2012)
Published in Microsystem technologies (01.08.2012)
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Journal Article
Conference Proceeding
Different types of ferrite thin films as magnetic cantilever coating for magnetic force microscopy
Koblischka, M.R., Kirsch, M., Pfeifer, R., Getlawi, S., Rigato, F., Fontcuberta, J., Sulzbach, T., Hartmann, U.
Published in Journal of magnetism and magnetic materials (01.05.2010)
Published in Journal of magnetism and magnetic materials (01.05.2010)
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Journal Article
Conference Proceeding
Piezoresistive and self-actuated 128-cantilever arrays for nanotechnology applications
Rangelow, I.W., Ivanov, Tzv, Ivanova, K., Volland, B.E., Grabiec, P., Sarov, Y., Persaud, A., Gotszalk, T., Zawierucha, P., Zielony, M., Dontzov, D., Schmidt, B., Zier, M., Nikolov, N., Kostic, I., Engl, W., Sulzbach, T., Mielczarski, J., Kolb, S., Latimier, Du P., Pedreau, R., Djakov, V., Huq, S.E., Edinger, K., Fortagne, O., Almansa, A., Blom, H.O.
Published in Microelectronic engineering (01.05.2007)
Published in Microelectronic engineering (01.05.2007)
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Journal Article
Conference Proceeding
Improvements of the lateral resolution of the MFM technique
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Journal Article
Conference Proceeding
High-frequency MFM characterization of magnetic recording writer poles
Koblischka, M. R., Wei, J. D., Sulzbach, T., Hartmann, U.
Published in Applied physics. A, Materials science & processing (01.02.2009)
Published in Applied physics. A, Materials science & processing (01.02.2009)
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Journal Article
Preparation of ferrite-coated MFM cantilevers
Koblischka, M.R., Kirsch, M., Wei, J., Sulzbach, T., Hartmann, U.
Published in Journal of magnetism and magnetic materials (01.09.2007)
Published in Journal of magnetism and magnetic materials (01.09.2007)
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Journal Article
Quantum size aspects of the piezoresistive effect in ultra thin piezoresistors
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Journal Article
Conference Proceeding
Downwards to metrology in nanoscale: determination of the AFM tip shape with well-known sharp-edged calibration structures
H bner, U., Morgenroth, W., Meyer, H.G., Sulzbach, T., Brendel, B., Mirand, W.
Published in Applied physics. A, Materials science & processing (01.04.2003)
Published in Applied physics. A, Materials science & processing (01.04.2003)
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Journal Article
Observation of Stray Fields From Hard-Disk Writer Poles up to 2 GHz
Koblischka, M.R., Wei, J.-D., Sulzbach, T., Johnston, A.D., Hartmann, U.
Published in IEEE transactions on magnetics (01.06.2007)
Published in IEEE transactions on magnetics (01.06.2007)
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Journal Article
Conference Proceeding
Improving the lateral resolution of the MFM technique to the [formula omitted] range
Koblischka, M.R, Hartmann, U, Sulzbach, T
Published in Journal of magnetism and magnetic materials (01.05.2004)
Published in Journal of magnetism and magnetic materials (01.05.2004)
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Journal Article
Advanced Cantilevers for Magnetic Force Microscopy and High Frequency Magnetic Force Microscopy
Koblischka, M. R., Wei, J. D., Richter, C., Sulzbach, T. H., Hartmann, U.
Published in Scanning (01.01.2008)
Published in Scanning (01.01.2008)
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Journal Article
Search for the optimally suited cantilever type for high-frequency MFM
Koblischka, M R, Wei, J D, Kirsch, M, Lessel, M, Pfeifer, R, Brust, M, Hartmann, U, Richter, C, Sulzbach, T
Published in Journal of physics. Conference series (01.03.2007)
Published in Journal of physics. Conference series (01.03.2007)
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Journal Article
AFM cantilever with ultra-thin transistor-channel piezoresistor: quantum confinement
Ivanov, Tzv, Gotszalk, T., Sulzbach, T., Chakarov, I., Rangelow, I.W.
Published in Microelectronic engineering (01.06.2003)
Published in Microelectronic engineering (01.06.2003)
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Journal Article
Conference Proceeding
Fabrication of silicon aperture probes for scanning near-field optical microscopy by focused ion beam nano machining
Lehrer, C., Frey, L., Petersen, S., Sulzbach, Th, Ohlsson, O., Dziomba, Th, Danzebrink, H.U., Ryssel, H.
Published in Microelectronic engineering (01.09.2001)
Published in Microelectronic engineering (01.09.2001)
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Journal Article
Conference Proceeding
High‐resolution constant‐height imaging with apertured silicon cantilever probes
Dziomba, T., Danzebrink, H. U., Lehrer, C., Frey, L., Sulzbach, T., Ohlsson, O.
Published in Journal of microscopy (Oxford) (01.04.2001)
Published in Journal of microscopy (Oxford) (01.04.2001)
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Journal Article
Nano‐slit probes for near‐field optical microscopy fabricated by focused ion beams
Danzebrink, H. U., Dziomba, TH, Sulzbach, T., Ohlsson, O., Lehrer, C., Frey, L.
Published in Journal of microscopy (Oxford) (01.05.1999)
Published in Journal of microscopy (Oxford) (01.05.1999)
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Journal Article
Resolving magnetic nanostructures in the 10-nm range using MFM at ambient conditions
Koblischka, M.R., Hartmann, U., Sulzbach, T.
Published in Materials Science & Engineering C (15.12.2003)
Published in Materials Science & Engineering C (15.12.2003)
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