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Journal Article
MULTI-SPOT SCANNING COLLECTION OPTICS
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Year of Publication 14.10.2016
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Year of Publication 14.10.2016
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Multi-spot scanning collection optics
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Year of Publication 15.05.2018
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MULTI-SPOT SCANNING COLLECTION OPTICS
Johnson Ralph, Cai Wenjian, Churin Evegeny, Moon Yong Mo, Sullivan Jamie M
Year of Publication 27.04.2017
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Year of Publication 27.04.2017
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Multi-spot scanning collection optics
Johnson Ralph, Cai Wenjian, Churin Evegeny, Moon Yong Mo, Sullivan Jamie M
Year of Publication 17.01.2017
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Year of Publication 17.01.2017
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Image synchronization of scanning wafer inspection system
SULLIVAN JAMIE M, CAO KAI, CAI WENJIAN, EMGE DENNIS G, WANG ZHIQIN, NIELSEN HENRIK
Year of Publication 08.12.2015
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Year of Publication 08.12.2015
Patent
MULTI-SPOT SCANNING COLLECTION OPTICS
MOON, YONG MO, CAI, WENJIAN, JOHNSON, RALPH, CHURIN, EVEGENY, SULLIVAN, JAMIE M
Year of Publication 20.08.2015
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Year of Publication 20.08.2015
Patent
MULTI-SPOT SCANNING COLLECTION OPTICS
SULLIVAN JAMIE M, CHURIN EVEGENY, MOON YONG MO, CAI WENJIAN, JOHNSON RALPH
Year of Publication 13.08.2015
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Year of Publication 13.08.2015
Patent
Enhanced high-speed logarithmic photo-detector for spot scanning system
DONDERS PAUL J, MACKAY DEREK C, SULLIVAN JAMIE M, CAO KAI, WOLF RALPH C, CHEN GRACE H
Year of Publication 12.07.2016
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Year of Publication 12.07.2016
Patent
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
SULLIVAN JAMIE M, CAO KAI, CAI WENJIAN, EMGE DENNIS G, WANG ZHIQIN, NIELSEN HENRIK
Year of Publication 18.06.2015
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Year of Publication 18.06.2015
Patent
Image synchronization of scanning wafer inspection system
SULLIVAN JAMIE M, CAO KAI, CAI WENJIAN, EMGE DENNIS G, WANG ZHIQIN, NIELSEN HENRIK
Year of Publication 31.03.2015
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Year of Publication 31.03.2015
Patent
IMAGE SYNCHRONIZATION OF SCANNING WAFER INSPECTION SYSTEM
SULLIVAN JAMIE M, CAO KAI, CAI WENJIAN, EMGE DENNIS G, WANG ZHIQIN, NIELSEN HENRIK
Year of Publication 18.09.2014
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Year of Publication 18.09.2014
Patent