Challenges and limitations of NAND flash memory devices based on floating gates
Byoungjun Park, Sunghoon Cho, Milim Park, Sukkwang Park, Yunbong Lee, Myoung Kwan Cho, Kun-Ok Ahn, Gihyun Bae, Sungwook Park
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
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Conference Proceeding
NAND Flash reliability degradation induced by HCI in boosted channel potential
Milim Park, Sukkwang Park, Seokwon Cho, Dong-Kyu Lee, YeonJoo Jeong, Chonga Hong, Ho Seok Lee, Myoung Kwan Cho, Kun-Ok Ahn, Yohwan Koh
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
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Conference Proceeding
The Operation Algorithm for Improving the Reliability of TLC (Triple Level Cell) NAND Flash Characteristics
Dong Wook Lee, Sunghoon Cho, Byung Woo Kang, Sukkwang Park, Byoungjun Park, Myoung Kwan Cho, Kun-Ok Ahn, Ye Seok Yang, Sung Wook Park
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
Published in 2011 3rd IEEE International Memory Workshop (IMW) (01.05.2011)
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An Investigation of Abnormal Program Phenomena with S/D Junctions and Dopant Profiles for Sub-20 nm NAND Flash Memory Devices
Byoungjun Park, Sunghoon Cho, Jiyul Park, Pyunghwa Kim, Sangjo Lee, Milim Park, Min Sang Park, Sukkwang Park, Hae Chang Yang, Sungjo Park, Yunbong Lee, Myoung Kwan Cho, Kun-Ok Ahn, Gihyun Bae, Sungwook Park
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)
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