Application of high pressure deuterium annealing for improving the hot carrier reliability of CMOS transistors
Jinju Lee, Kangguo Cheng, Zhi Chen, Hess, K., Lyding, J.W., Young-Kwang Kim, Hyui-Seung Lee, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE electron device letters (01.05.2000)
Published in IEEE electron device letters (01.05.2000)
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Journal Article
Ultrathin gate oxide grown on nitrogen-implanted silicon for deep submicron CMOS transistors
Nam, In-Ho, Sim, Jae Sung, Hong, Sung In, Park, Byung-Gook, Lee, Jong Duk, Lee, Seung-Woo, Kang, Man-Sug, Kim, Young-Wug, Suh, Kwang-Pyuk, Lee, Won Seong
Published in IEEE transactions on electron devices (01.10.2001)
Published in IEEE transactions on electron devices (01.10.2001)
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Journal Article
A 0.25-μm, 600-MHz, 1.5-V, fully depleted SOI CMOS 64-bit microprocessor
Park, Sung Bae, Kim, Young Wug, Ko, Young Gun, Kim, Kwang Il, Kim, Il Kwon, Kang, Hee-Sung, Yu, Jin Oh, Suh, Kwang Pyuk
Published in IEEE journal of solid-state circuits (01.11.1999)
Published in IEEE journal of solid-state circuits (01.11.1999)
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Journal Article
Improved hot-carrier reliability of SOI transistors by deuterium passivation of defects at oxide/silicon interfaces
Kangguo Cheng, Jinju Lee, Karl, H., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE transactions on electron devices (01.03.2002)
Published in IEEE transactions on electron devices (01.03.2002)
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Journal Article
An alternative interpretation of hot electron interface degradation in NMOSFETs: isotope results irreconcilable with major defect generation by holes?
Hess, K., Jinju Lee, Zhi Chen, Lyding, J.W., Young-Kwang Kim, Bong-Seok Kim, Yong-Hee Lee, Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE transactions on electron devices (01.09.1999)
Published in IEEE transactions on electron devices (01.09.1999)
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Journal Article
Device Performance Improvement Based on Transient Enhanced Diffusion Suppression in the Deep Sub-Quarter Micron Scale
Hyun-Sik Kim, Hyun-Sik Kim, Jong-Hyon Ahn, Jong-Hyon Ahn, Duk-Min Lee, Duk-Min Lee, Kwang-Dong Yoo, Kwang-Dong Yoo, Soo-Cheol Lee, Soo-Cheol Lee, Kwang-Pyuk Suh, Kwang-Pyuk Suh
Published in Japanese Journal of Applied Physics (01.04.2000)
Published in Japanese Journal of Applied Physics (01.04.2000)
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Journal Article
HCI and BTI characteristics of ALD HfSiO(N) gate dielectrics as the compositions and the post treatment conditions
JONG PYO KIM, KIM, Yun-Seok, KANG, Ho-Kyu, SUH, Kwang-Pyuk, CHUNG, Young-Su, HA JIN LIM, JUNG HYOUNG LEE, SEOK JOO DOH, JUNG, Hyung-Suk, HAN, Sung-Kee, KIM, Min-Joo, LEE, Jong-Ho, LEE, Nae-In
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
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Conference Proceeding
Integration of MIM capacitors with low-k/Cu process for 90 nm analog circuit applications
Jeong-Hoon Ahm, Kyung-Tae Lee, Mu-Kyeung Jung, Yong-Jun Lee, Byung-Jun Oh, Seong-Ho Liu, Yoon-Hae Kim, Young-Wug Kim, Kwang-Pyuk Suh
Published in Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) (2003)
Published in Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) (2003)
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Conference Proceeding
Improved current performance of CMOSFETs with nitrogen incorporated HfO2-Al2O3 laminate gate dielectric
Hyung-Seok Jung, Yun-Seok Kim, Jong Pyo Kim, Jung Hyoung Lee, Jong-Ho Lee, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh, Hyuk Ju Ryu, Chang-Bong Oh, Young-Wug Kim, Kyung-Hwan Cho, Hion-Suck Baik, Young Su Chung, Hyo Sik Chang, Dae Won Moon
Published in Digest. International Electron Devices Meeting (2002)
Published in Digest. International Electron Devices Meeting (2002)
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Conference Proceeding
Highly controllable cyclic selective epitaxial growth (CySEG) for 65nm CMOS technology and beyond
SEUNG HWAN LEE, DONG SUK SHIN, HWA SUNG RHEE, UENO, Tetsuji, LEE, Ho, MOON HAN PARK, LEE, Nae-In, KANG, Ho-Kyu, SUH, Kwang-Pyuk
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
Published in IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 (2004)
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Conference Proceeding
High performance 0.18 um nMOSFET by TED suppression
Hyun-Sik Kim, Jong-Hyon Ahn, Duk-Min Lee, Soo-Cheol Lee, Kwang-Pyuk Suh
Published in ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) (1999)
Published in ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) (1999)
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Conference Proceeding
High performance NPN BJTs in standard CMOS process for GSM transceiver and DVB-H tuner
Jedon Kim, Hansu Oh, Chulho Chung, Joo-Hyun Jjeong, Hyunwoo Lee, Seok-Hee Hwang, In-Chul Hwang, Young-Jin Kim, Kyushik Hong, Eunseung Jung, Kwang-Pyuk Suh
Published in IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 (2006)
Published in IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 (2006)
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Conference Proceeding
A 0.25-mu m, 600-MHz, 1.5-V, fully depleted SOI CMOS 64-bitmicroprocessor
Park, Sung Bae, Kim, Young Wug, Ko, Young Gun, Kim, Kwang Il, Kim, Il Kwon, Kang, Hee-Sung, Yu, Jin Oh, Suh, Kwang Pyuk
Published in IEEE journal of solid-state circuits (01.11.1999)
Published in IEEE journal of solid-state circuits (01.11.1999)
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Journal Article
A 0.25-/spl mu/m, 600-MHz, 1.5-V, fully depleted SOI CMOS 64-bit microprocessor
Sung Bae Park, Young Wug Kim, Young Gun Ko, Kwang Il Kim, Il Kwon Kim, Hee-Sung Kang, Jin Oh Yu, Kwang Pyuk Suh
Published in IEEE journal of solid-state circuits (01.11.1999)
Published in IEEE journal of solid-state circuits (01.11.1999)
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Journal Article
High quality high-k MIM capacitor by Ta2O5/HfO2/Ta2O5 multi-layered dielectric and nh3 plasma interface treatments for mixed-signal/RF applications
JEONG, Yong-Kuk, WON, Seok-Jun, KWON, Dae-Jin, SONG, Min-Woo, KIM, Weon-Hong, PARK, Moon-Han, JEONG, Joo-Hyun, OH, Han-Su, KANG, Ho-Kyu, SUH, Kwang-Pyuk
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Conference Proceeding
Fully working 1.25 /spl mu/m/sup 2/ 6T-SRAM cell with 45 nm gate length triple gate transistors
Jeong-Hwan Yang, You-Seung Jin, Hyae-Ryoung Lee, Kyoung-Seok Rha, Jung-A Choi, Su-Kon Bae, Maeda, S., Young-Wug Kim, Kwang-Pyuk Suh
Published in IEEE International Electron Devices Meeting 2003 (2003)
Published in IEEE International Electron Devices Meeting 2003 (2003)
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Conference Proceeding
Double raised source/drain transistor with 50 nm gate length on 17 nm UTF-SOI for 1.1 /spl mu/m/sup 2/ embedded SRAM technology
Chang Bong Oh, Myoung Hwan Oh, Hee Sung Kang, Chang Hyun Park, Byung Jun Oh, Yoon Hae Kim, Hwa Sung Rhee, Young Wug Kim, Kwang Pyuk Suh
Published in IEEE International Electron Devices Meeting 2003 (2003)
Published in IEEE International Electron Devices Meeting 2003 (2003)
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Conference Proceeding
Impact of mechanical stress engineering on flicker noise characteristics
Maeda, S., You-Seung Jin, Jung-A Choi, Sun-Young Oh, Hyun-Woo Lee, Jae-Yoon Yoo, Min-Chul Sun, Ja-Hum Ku, Kwon Lee, Su-Gon Bae, Sung-Gun Kang, Jeong-Hwan Yang, Young-Wug Kim, Kwang-Pyuk Suh
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
Published in Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004 (2004)
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Conference Proceeding