Reliability of Low Temperature Polycrystalline Silicon Thin-Film Transistors with Ultrathin Gate Oxide
Ueno, Hitoshi, Sugawara, Yuta, Yano, Hiroshi, Hatayama, Tomoaki, Uraoka, Yukiharu, Fuyuki, Takashi, Serikawa, Tadashi
Published in Japanese Journal of Applied Physics (01.07.2007)
Published in Japanese Journal of Applied Physics (01.07.2007)
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Journal Article
Improvement of Reliability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors by Water Vapor Annealing
Uraoka, Yukiharu, Miyashita, Makoto, Sugawara, Yuta, Yano, Hiroshi, Hatayama, Tomoaki, Fuyuki, Takashi, Sameshima, Toshiyuki
Published in Japanese Journal of Applied Physics (01.07.2006)
Published in Japanese Journal of Applied Physics (01.07.2006)
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Journal Article
Reliability Analysis of Ultra Low-Temperature Polycrystalline Silicon Thin-Film Transistors
Ueno, Hitoshi, Sugawara, Yuta, Yano, Hiroshi, Hatayama, Tomoaki, Uraoka, Yukiharu, Fuyuki, Takashi, Jung, Ji Sim, Park, Kyung Bae, Kim, Jong Man, Kwon, Jang Yeon, Noguchi, Takashi
Published in Japanese Journal of Applied Physics (01.03.2007)
Published in Japanese Journal of Applied Physics (01.03.2007)
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Journal Article
Crystallinity Evaluation by Microwave Photoconductivity Decay in Double-Layered Polycrystalline Silicon Thin Films Crystallized by Solid Green Laser Annealing
Sugawara, Yuta, Uraoka, Yukiharu, Yano, Hiroshi, Hatayama, Tomoaki, Fuyuki, Takashi, Mimura, Akio
Published in Japanese Journal of Applied Physics (01.12.2007)
Published in Japanese Journal of Applied Physics (01.12.2007)
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Aqueous photochemical degradation of mefenamic acid and triclosan: role of wastewater effluent matrices
Sankoda, Kenshi, Sugawara, Yuta, Aida, Takuya, Yamamoto, Chieko, Kobayashi, Jun, Sekiguchi, Kazuhiko, Wang, Qingyue
Published in Water science and technology (01.05.2019)
Published in Water science and technology (01.05.2019)
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