Artifact and Fact of Si(111)7×7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM)
Nobuhito Suehira, Nobuhito Suehira, Yasuhiro Sugawara, Yasuhiro Sugawara, Seizo Morita, Seizo Morita
Published in Japanese Journal of Applied Physics (15.03.2001)
Published in Japanese Journal of Applied Physics (15.03.2001)
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