Lock-in detection for pulsed electrically detected magnetic resonance
Hoehne, Felix, Dreher, Lukas, Behrends, Jan, Fehr, Matthias, Huebl, Hans, Lips, Klaus, Schnegg, Alexander, Suckert, Max, Stutzmann, Martin, Brandt, Martin S
Published in Review of scientific instruments (01.04.2012)
Published in Review of scientific instruments (01.04.2012)
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Journal Article
Electrically detected double electron-electron resonance: exchange interaction of P donors and P defects at the Si/SiO interface
Suckert, Max, Hoehne, Felix, Dreher, Lukas, Kuenzl, Markus, Huebl, Hans, Stutzmann, Martin, Brandt, Martin S.
Published in Molecular physics (01.10.2013)
Published in Molecular physics (01.10.2013)
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Journal Article
Electrically Detected Double Electron-Electron Resonance: Exchange Interaction of 31P Donors and Pb0 Defects at the Si/SiO2 Interface
Suckert, Max, Hoehne, Felix, Dreher, Lukas, Kuenzl, Markus, Huebl, Hans, Stutzmann, Martin, Brandt, Martin S
Published in arXiv.org (26.06.2013)
Published in arXiv.org (26.06.2013)
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Paper
Journal Article
Lock-in detection for pulsed electrically detected magnetic resonance
Hoehne, Felix, Dreher, Lukas, Behrends, Jan, Fehr, Matthias, Huebl, Hans, Lips, Klaus, Schnegg, Alexander, Suckert, Max, Stutzmann, Martin, Brandt, Martin S
Published in arXiv.org (22.11.2011)
Published in arXiv.org (22.11.2011)
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Journal Article