by Subhechha, S., Degraeve, R., Roussel, P., Goux, L., Clima, S., De Meyer, K., Van Houdt, J., Kar, G.S.
Published in Microelectronic engineering (25.06.2017)

by Govoreanu, B., Crotti, D., Subhechha, S., Zhang, L., Chen, Y. Y., Clima, S., Paraschiv, V., Hody, H., Adelmann, C., Popovici, M., Richard, O., Jurczak, M.
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Chasin, A., Franco, J., Triantopoulos, K., Dekkers, H., Rassoul, N., Belmonte, A., Smets, Q., Subhechha, S., Claes, D., van Setten, M. J., Mitard, J., Delhougne, R., Afanas'ev, V., Kaczer, B., Kar, G. S.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)

by Magnarin, L., Agati, M., Belmonte, A., Subhechha, S., Rassoul, N., Drijbooms, C., Dekkers, H., Celano, U.
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)

by Wu, Z., Chasin, A., Franco, J., Subhechha, S., Dekkers, H., Bhuvaneshwari, Y.V., Belmonte, A., Rassoul, N., van Setten, M.J., Afanas'Ev, V., Delhougne, R., Kaczer, B., Kar, G.S.
Published in 2022 International Electron Devices Meeting (IEDM) (03.12.2022)

by Belmonte, A., Kundu, S., Subhechha, S., Chasin, A., Rassoul, N., Dekkers, H., Puliyalil, H., Seidel, F., Carolan, P., Delhougne, R., Kar, G. S.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Subhechha, S., Rassoul, N., Belmonte, A., Hody, H., Dekkers, H., van Setten, M. J., Chasin, A., Sharifi, S.H., Sutar, S., Magnarin, L., Celano, U., Puliyalil, H., Kundu, S., Pak, M., Teugels, L., Tsvetanova, D., Bazzazian, N., Vandersmissen, K., Biasotto, C., Batuk, D., Geypen, J., Heijlen, J., Delhougne, R., Kar, G. S.
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12.06.2022)

by Subhechha, S., Rassoul, N., Belmonte, A., Hody, H., Dekkers, H., van Setten, M. J., Chasin, A., Sharifi, S.H., Banerjee, K., Puliyalil, H., Kundu, S., Pak, M., Tsvetanova, D., Bazzazian, N., Vandersmissen, K., Batuk, D., Geypen, J., Heijlen, J., Delhougne, R., Kar, G. S.
Published in 2022 International Conference on IC Design and Technology (ICICDT) (21.09.2022)

by Subhechha, S., Rassoul, N., Belmonte, A., Delhougne, R., Banerjee, K., Donadio, G. L., Dekkers, H., van Setten, M. J., Puliyalil, H., Mao, M., Kundu, S., Pak, M., Teugels, L., Tsvetanova, D., Bazzazian, N., Klijs, L., Hody, H., Chasin, A., Heijlen, J., Goux, L., Kar, G. S.
Published in 2021 Symposium on VLSI Technology (13.06.2021)

by Belmonte, A., Oh, H., Rassoul, N., Donadio, G.L., Mitard, J., Dekkers, H., Delhougne, R., Subhechha, S., Chasin, A., van Setten, M. J., Kljucar, L., Mao, M., Puliyalil, H., Pak, M., Teugels, L., Tsvetanova, D., Banerjee, K., Souriau, L., Tokei, Z., Goux, L., Kar, G. S.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)

by Belmonte, A., Oh, H., Subhechha, S., Rassoul, N., Hody, H., Dekkers, H., Delhougne, R., Ricotti, L., Banerjee, K., Chasin, A., van Setten, M. J., Puliyalil, H., Pak, M., Teugels, L., Tsvetanova, D., Vandersmissen, K., Kundu, S., Heijlen, J., Batuk, D., Geypen, J., Goux, L., Kar, G. S.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)

by Rinaudo, P., Chasin, A., Franco, J., Wu, Z., Subhechha, S., Arutchelvan, G., Eneman, G., Ramana, B. Y. V., Rassoul, N., Delhougne, R., Kaczer, B., Wolf, I. De, Kar, G.S.
Published in IEEE transactions on device and materials reliability (01.09.2023)

by Celano, U., Gastaldi, C., Subhechha, S., Govoreanu, B., Donadio, G., Franquet, A., Ahmad, T., Detavernier, C., Richard, O., Bender, H., Goux, L., Kar, G. S., van der Heide, P., Vandervorst, W.
Published in 2017 IEEE International Electron Devices Meeting (IEDM) (01.12.2017)