A Digital Bridge Evaluation up to 100 kHz for Precision Impedance Measurements
Kim, Dan Bee, Shin, Seong Su, Kim, Wan-Seop, Kucera, Jan
Published in IEEE transactions on instrumentation and measurement (01.01.2023)
Published in IEEE transactions on instrumentation and measurement (01.01.2023)
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Journal Article
L-shaped tunnel FET with stacked gates to suppress the corner effect
Shin, Seong Su, Kim, Jang Hyun, Kim, Sangwan
Published in Japanese Journal of Applied Physics (01.06.2019)
Published in Japanese Journal of Applied Physics (01.06.2019)
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Journal Article
Comparing and analysis of ground resistance measurement method by application of IEEE Std81.2 and IEC60364
Woon-Ki Han, Jin-soo Jeong, Seong-Su Shin, Joong-soo Choi, Jae-Cheol Kim
Published in CPEM 2010 (01.06.2010)
Published in CPEM 2010 (01.06.2010)
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Conference Proceeding
Characterization of Closed-Cycle Toploader for Quantum Resistance Standard in Graphene at KRISS
Chae, Dong-Hun, Park, Jaesung, Shin, Seong Su
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
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Conference Proceeding
Digital Bridge Voltage Ratio Calibration using an Automated Permuting Capacitive Device
Shin, Seong Su, Kim, Wan-Seop, Kim, Dan Bee
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
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Conference Proceeding
Transient Analysis of Tunnel Field-Effect Transistor with Raised Drain
Kim, Jang Hyun, Kim, Hyun Woo, Shin, Seong-Su, Kim, Sangwan, Park, Byung-Gook
Published in Journal of nanoscience and nanotechnology (01.10.2019)
Published in Journal of nanoscience and nanotechnology (01.10.2019)
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Journal Article
Preliminary Measurements on AC Quantum Hall Resistance in Graphene at KRISS
Kim, Dan Bee, Chae, Dong-Hun, Park, Jae Sung, Kim, Wan-Seop, Shin, Seong Su
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
Published in 2024 Conference on Precision Electromagnetic Measurements (CPEM) (08.07.2024)
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Conference Proceeding