Exploring regular fabrics to optimize the performance-cost trade-off
Pileggi, L., Schmit, H., Strojwas, A. J., Gopalakrishnan, P., Kheterpal, V., Koorapaty, A., Patel, C., Rovner, V., Tong, K. Y.
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 40th conference on Design automation; 02-06 June 2003 (02.06.2003)
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 40th conference on Design automation; 02-06 June 2003 (02.06.2003)
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Conference Proceeding
Design methodology for IC manufacturability based on regular logic-bricks
Kheterpal, V., Rovner, V., Hersan, T. G., Motiani, D., Takegawa, Y., Strojwas, A. J., Pileggi, L.
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 42nd annual conference on Design automation; 13-17 June 2005 (13.06.2005)
Published in Annual ACM IEEE Design Automation Conference: Proceedings of the 42nd annual conference on Design automation; 13-17 June 2005 (13.06.2005)
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Conference Proceeding
In-line defect sampling methodology in yield management: an integrated framework
Nurani, R.K., Akella, R., Strojwas, A.J.
Published in IEEE transactions on semiconductor manufacturing (01.11.1996)
Published in IEEE transactions on semiconductor manufacturing (01.11.1996)
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Journal Article
Conference Proceeding
Effective excursion detection by defect type grouping in in-line inspection and classification
Shindo, W., Wang, E.H., Akella, R., Strojwas, A.J., Tomlinson, W., Bartholomew, R.
Published in IEEE transactions on semiconductor manufacturing (01.02.1999)
Published in IEEE transactions on semiconductor manufacturing (01.02.1999)
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Journal Article
Conference Proceeding
In-line yield prediction methodologies using patterned wafer inspection information
Nurani, R.K., Strojwas, A.J., Maly, W.P., Ouyang, C., Shindo, W., Akella, R., McIntyre, M.G., Derrett, J.
Published in IEEE transactions on semiconductor manufacturing (01.02.1998)
Published in IEEE transactions on semiconductor manufacturing (01.02.1998)
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Journal Article
Conference Proceeding
Monitoring multistage integrated circuit fabrication processes
Rao, S., Strojwas, A.J., Lehoczky, J.P., Schervish, M.J.
Published in IEEE transactions on semiconductor manufacturing (01.11.1996)
Published in IEEE transactions on semiconductor manufacturing (01.11.1996)
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Journal Article
Conference Proceeding
The application of submicron lithography defect simulation to IC yield improvement
Milor, L.S., Orth, J., Steele, D., Khoi Phan, Xiaolei Li, Strojwas, A.J.
Published in IEEE transactions on semiconductor manufacturing (01.02.1999)
Published in IEEE transactions on semiconductor manufacturing (01.02.1999)
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Journal Article
Conference Proceeding
Effects of defect propagation/growth on in-line defect-based yield prediction
Shindo, W., Nurani, R.K., Strojwas, A.J.
Published in IEEE transactions on semiconductor manufacturing (01.11.1998)
Published in IEEE transactions on semiconductor manufacturing (01.11.1998)
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Journal Article
Conference Proceeding
VLSI Yield Prediction and Estimation: A Unified Framework
Maly, W., Strojwas, A.J., Director, S.W.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1986)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1986)
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Journal Article
Efficient macromodeling of defect propagation/growth mechanisms in VLSI fabrication
Li, X., Strojwas, A.J., Reddy, M., Milor, L.S.
Published in IEEE transactions on semiconductor manufacturing (01.11.1998)
Published in IEEE transactions on semiconductor manufacturing (01.11.1998)
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Journal Article
Conference Proceeding
A Methodology for Worst-Case Analysis of Integrated Circuits
Nassif, S.R., Strojwas, A.J., Director, S.W.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1986)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.1986)
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Journal Article
Perspectives on technology and technology-driven CAD
Dutton, R.W., Strojwas, A.J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2000)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.12.2000)
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Journal Article
Realistic Yield Simulation for VLSIC Structural Failures
Ihao Chen, Strojwas, A.J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.1987)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.1987)
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Journal Article
Numerical integral method for diffusion modeling
Tian, X., Strojwas, A.J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.1991)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.1991)
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Journal Article
A New Approach to Hierarchical and Statistical Timing Simulations
Benkoski, J., Strojwas, A.J.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.1987)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.1987)
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Journal Article