SIMS measurements of oxygen impurities in AlGaInP semiconductor material and laser diodes
Najda, S.P., Kean, A., Streater, R.W., SpringThorpe, A.J.
Published in Journal of crystal growth (01.12.2000)
Published in Journal of crystal growth (01.12.2000)
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Journal Article
Determination of Al Ga(1 − )As composition: the MBE perspective
Wasilewski, Z.R., Dion, M.M., Lockwood, D.J., Poole, P., Streater, R.W., SpringThorpe, A.J.
Published in Journal of crystal growth (01.05.1997)
Published in Journal of crystal growth (01.05.1997)
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Journal Article
Device quality AlGaAs grown by chemical beam epitaxy
Moore, W.T., Mandeville, P., Streater, R.W., Miner, C.J.
Published in Journal of crystal growth (01.07.1996)
Published in Journal of crystal growth (01.07.1996)
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Journal Article
Conference Proceeding
Determination of AlxGa(1 − x)As composition: the MBE perspective
Wasilewski, Z.R., Dion, M.M., Lockwood, D.J., Poole, P., Streater, R.W., SpringThorpe, A.J.
Published in Journal of crystal growth (01.05.1997)
Published in Journal of crystal growth (01.05.1997)
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Journal Article
Iodine-assisted molecular beam epitaxy
Micovic, M., Lubyshev, D., Cai, W.Z., Flack, F., Streater, R.W., SpringThorpe, A.J., Miller, D.L.
Published in Journal of crystal growth (01.05.1997)
Published in Journal of crystal growth (01.05.1997)
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Journal Article
Characterization of He-plasma-assisted GSMBE InGaAsP
Pinkney, H., Thompson, D.A., Robinson, B.J., Simpson, P.J., Myler, U., Streater, R.W.
Published in Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362) (1999)
Published in Conference Proceedings. Eleventh International Conference on Indium Phosphide and Related Materials (IPRM'99) (Cat. No.99CH36362) (1999)
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Conference Proceeding
Low energy electron diffraction intensities from the (311) surface of copper
Moore, W.T., Streater, R.W., Frost, D.C., Mitchell, K.A.R.
Published in Solid state communications (01.01.1977)
Published in Solid state communications (01.01.1977)
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Journal Article
The structure of the (311) surface of copper as determined by multiple scattering calculations of LEED intensities
Streater, R.W., Moore, W.T., Watson, P.R., Frost, D.C., Mitchell, K.A.R.
Published in Surface science (01.01.1978)
Published in Surface science (01.01.1978)
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