Nonlinear decision boundaries for testing analog circuits
Stratigopoulos, H.-G.D., Makris, Y.
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2005)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.11.2005)
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Journal Article
Concurrent error detection in linear analog circuits using state estimation
Stratigopoulos, H.-G.D., Makris, Y.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)
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Conference Proceeding
An analog checker with input-relative tolerance for duplicate signals
Stratigopoulos, H.-G.D., Makris, Y.
Published in 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003 (2003)
Published in 9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003 (2003)
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Conference Proceeding
Non-RF to RF Test Correlation Using Learning Machines: A Case Study
Stratigopoulos, H.-G.D., Drineas, P., Slamani, M., Makris, Y.
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01.05.2007)
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01.05.2007)
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Conference Proceeding