Reconstruction of Confocal Micro-X-ray Fluorescence Spectroscopy Depth Scans Obtained with a Laboratory Setup
Mantouvalou, Ioanna, Wolff, Timo, Seim, Christian, Stoytschew, Valentin, Malzer, Wolfgang, Kanngießer, Birgit
Published in Analytical chemistry (Washington) (07.10.2014)
Published in Analytical chemistry (Washington) (07.10.2014)
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Influence of experimental parameters on secondary ion yield for MeV-SIMS
Stoytschew, Valentin, Bogdanović Radović, Iva, Siketić, Zdravko, Jakšić, Milko
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.08.2017)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.08.2017)
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Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions
Bogdanović Radović, Iva, Siketić, Zdravko, Jembrih-Simbürger, Dubravka, Marković, Nikola, Anghelone, Marta, Stoytschew, Valentin, Jakšić, Milko
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.09.2017)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.09.2017)
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MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter
Stoytschew, Valentin, Bogdanović Radović, Iva, Demarche, Julien, Jakšić, Milko, Matjačić, Lidija, Siketić, Zdravko, Webb, Roger
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (15.03.2016)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (15.03.2016)
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