Charge-pumping characterization of SiO/sub 2//Si interface in virgin and irradiated power VDMOSFETs
Habas, P., Prijic, Z., Pantic, D., Stojadinovic, N.D.
Published in IEEE transactions on electron devices (01.12.1996)
Published in IEEE transactions on electron devices (01.12.1996)
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Journal Article
The determination of zero temperature coefficient point in CMOS transistors
Prijić, Z.D., Dimitrijev, S.S., Stojadinović, N.D.
Published in Microelectronics and reliability (1992)
Published in Microelectronics and reliability (1992)
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Journal Article
Analysis of temperature dependence of CMOS transistors' threshold voltage
Prijić, Z.D., Dimitrijev, S.S., Stojadinović, N.D.
Published in Microelectronics and reliability (1991)
Published in Microelectronics and reliability (1991)
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Journal Article