Anthranilic diamides: A new class of insecticides with a novel mode of action, ryanodine receptor activation
Cordova, D., Benner, E.A., Sacher, M.D., Rauh, J.J., Sopa, J.S., Lahm, G.P., Selby, T.P., Stevenson, T.M., Flexner, L., Gutteridge, S., Rhoades, D.F., Wu, L., Smith, R.M., Tao, Y.
Published in Pesticide biochemistry and physiology (01.03.2006)
Published in Pesticide biochemistry and physiology (01.03.2006)
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Journal Article
Fabrication and Measurement of Test Structures to Monitor Stress in SU-8 Films
Smith, S., Brockie, N. L., Murray, J., Schiavone, G., Wilson, C. J., Horsfall, A. B., Terry, J. G., Stevenson, J. T. M., Mount, A. R., Walton, A. J.
Published in IEEE transactions on semiconductor manufacturing (01.08.2012)
Published in IEEE transactions on semiconductor manufacturing (01.08.2012)
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Journal Article
Conference Proceeding
Development of a miniaturised drug delivery system with wireless power transfer and communication
Smith, S, Tang, T B, Terry, J G, Stevenson, J T M, Flynn, B W, Reekie, H M, Murray, A F, Gundlach, A M, Renshaw, D, Dhillon, B, Ohtori, A, Inoue, Y, Walton, A J
Published in IET nanobiotechnology (01.10.2007)
Published in IET nanobiotechnology (01.10.2007)
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Journal Article
Characterisation and integration of Parylene as an insulating structural layer for high aspect ratio electroplated copper coils
Walker, R., Sirotkin, E., Schmueser, I., Terry, J. G., Smith, S., Stevenson, J. T. M., Walton, A. J.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Direct Al–Al contact using low temperature wafer bonding for integrating MEMS and CMOS devices
Lin, H., Stevenson, J.T.M., Gundlach, A.M., Dunare, C.C., Walton, A.J.
Published in Microelectronic engineering (01.05.2008)
Published in Microelectronic engineering (01.05.2008)
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Journal Article
Conference Proceeding
Design and fabrication of dielectric diaphragm pressure sensors for applications to shock wave measurement in air
Parkes, W, Djakov, V, Barton, J S, Watson, S, MacPherson, W N, Stevenson, J T M, Dunare, C C
Published in Journal of micromechanics and microengineering (01.07.2007)
Published in Journal of micromechanics and microengineering (01.07.2007)
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Journal Article
Test structures for electrical evaluation of high aspect ratio TSV arrays fabricated using planarised sacrificial photoresist
Zhang, R., Li, Y., Murray, J., Bunting, A. S., Smith, S., Dunare, C. C., Stevenson, J. T. M., Desmulliez, M. P., Walton, A. J.
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
Published in 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2013)
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Conference Proceeding
Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics
Yifan Li, Fu, R. Y., Winters, D., Flynn, B. W., Parkes, B., Brodie, D. S., Yufei Liu, Terry, J., Haworth, L. I., Bunting, A. S., Stevenson, J. T. M., Smith, S., Mackay, C. L., Langridge-Smith, P. R. R., Stokes, A. A., Walton, A. J.
Published in IEEE transactions on semiconductor manufacturing (01.08.2012)
Published in IEEE transactions on semiconductor manufacturing (01.08.2012)
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Journal Article
Conference Proceeding
Implementation of wireless power transfer and communications for an implantable ocular drug delivery system
Tang, T B, Smith, S, Flynn, B W, Stevenson, J T M, Gundlach, A M, Reekie, H M, Murray, A F, Renshaw, D, Dhillon, B, Ohtori, A, Inoue, Y, Terry, J G, Walton, A J
Published in IET nanobiotechnology (01.09.2008)
Published in IET nanobiotechnology (01.09.2008)
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Journal Article
An evaluation of test structures for measuring the contact resistance of 3-D bonded interconnects
Lin, H., Smith, S., Stevenson, J.T.M., Gundlach, A.M., Dunare, C.C., Walton, A.J.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
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Conference Proceeding
Comparison of Measurement Techniques for Linewidth Metrology on Advanced Photomasks
Smith, S., Tsiamis, A., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Walton, A.J., Dixson, R.G., Allen, R.A., Potzick, J.E., Cresswell, M.W., Orji, N.G.
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
Published in IEEE transactions on semiconductor manufacturing (01.02.2009)
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Journal Article
Direct measurement of residual stress in sub-micron interconnects
Horsfall, A B, Santos, J M M dos, Soare, S M, Wright, N G, O'Neill, A G, Bull, S J, Walton, A J, Gundlach, A M, Stevenson, J T M
Published in Semiconductor science and technology (01.11.2003)
Published in Semiconductor science and technology (01.11.2003)
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Journal Article
Kelvin resistor structures for the investigation of corner serif Proximity Correction
Smith, S, Tsiamis, A, McCallum, M, Hourd, A C, Stevenson, J T M, Walton, A J
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
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Conference Proceeding
Analysis of the performance of a micromechanical test structure to measure stress in thick electroplated metal films
Smith, S, Brockie, N L, Murray, J, Wilson, C J, Horsfall, A B, Terry, J G, Stevenson, J T M, Mount, A R, Walton, A J
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
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Conference Proceeding
Electrical Test Structures for Investigating the Effects of Optical Proximity Correction
Tsiamis, A., Smith, S., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Walton, A.J.
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
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Conference Proceeding
Fabrication of test structures to monitor stress in SU-8 films used for MEMS applications
Smith, S, Brockie, N L, Murray, J, Wilson, C J, Horsfall, A B, Terry, J G, Stevenson, J T M, Mount, A R, Walton, A J
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
Published in 2010 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2010)
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Conference Proceeding
Application of Matching Structures to Identify the Source of Systematic Dimensional Offsets in GHOST Proximity Corrected Photomasks
Smith, S., Tsiamis, A., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Walton, A.J.
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
Published in 2009 IEEE International Conference on Microelectronic Test Structures (01.03.2009)
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Conference Proceeding