Multi-pass spectroscopic ellipsometry
Stehle, Jean-Louis, Samartzis, Peter C., Stamataki, Katerina, Piel, Jean-Philippe, Katsoprinakis, George E., Papadakis, Vassilis, Schimowski, Xavier, Rakitzis, T. Peter, Loppinet, Benoit
Published in Thin solid films (31.03.2014)
Published in Thin solid films (31.03.2014)
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Journal Article
Conference Proceeding
Sensitivity enhancement for evanescent-wave sensing using cavity-ring-down ellipsometry
Sofikitis, Dimitris, Stamataki, Katerina, Everest, Michael A, Papadakis, Vassilis, Stehle, Jean-Louis, Loppinet, Benoit, Rakitzis, T Peter
Published in Optics letters (15.04.2013)
Published in Optics letters (15.04.2013)
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Journal Article
Unconditionally stable indole-derived glass blends having very high photorefractive gain: the role of intermolecular interactions
Angelone, Rocco, Ciardelli, Francesco, Colligiani, Arturo, Greco, Francesco, Masi, Paolo, Romano, Annalisa, Ruggeri, Giacomo, Stehlé, Jean-Louis
Published in Applied optics. Optical technology and biomedical optics (20.12.2008)
Published in Applied optics. Optical technology and biomedical optics (20.12.2008)
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Journal Article
Optical properties of NiCrOx thin films
Dahmouchène, Nora, Voué, Michel, Stehlé, Jean-Louis, Defranoux, Christophe, Nouvellon, Corinne, De Coninck, Joel
Published in Physica status solidi. C (01.05.2008)
Published in Physica status solidi. C (01.05.2008)
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Journal Article
Characterization of ultrathin gate dielectrics by grazing X-ray reflectance and VUV spectroscopic ellipsometry on the same instrument
Boher, Pierre, Evrard, Patrick, Piel, Jean Philippe, Stehle, Jean Louis
Published in Journal of non-crystalline solids (01.05.2002)
Published in Journal of non-crystalline solids (01.05.2002)
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Journal Article
Conference Proceeding
Deep ultra-violet measurements of SiON anti-reflective coatings by spectroscopic ellipsometry
Defranoux, Christophe, Piel, Jean-Philippe, Stehle, Jean-Louis
Published in Thin solid films (01.02.1998)
Published in Thin solid films (01.02.1998)
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Journal Article
High-speed broadband FTIR system using MEMS
Pelin Ayerden, N, Aygun, Ugur, Holmstrom, Sven T S, Olcer, Selim, Can, Basarbatu, Stehle, Jean-Louis, Urey, Hakan
Published in Applied optics. Optical technology and biomedical optics (01.11.2014)
Published in Applied optics. Optical technology and biomedical optics (01.11.2014)
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Journal Article
Infrared Spectroscopic Ellipsometry analysis of Nano-structured thin films in polymers and semiconductors
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Journal Article
Conference Proceeding
MEMS FTIR spectrometer and optical results
Ayerden, N. P., Stehle, J-L, Holmstrom, S., Urey, H.
Published in 2012 International Conference on Optical MEMS and Nanophotonics (01.08.2012)
Published in 2012 International Conference on Optical MEMS and Nanophotonics (01.08.2012)
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Conference Proceeding
IR spectroscopic ellipsometry: instrumentation and applications in semiconductors
Zalczer, Gilbert, Thomas, Olivier, Piel, Jean-Philippe, Stehlé, Jean-Louis
Published in Thin solid films (25.10.1993)
Published in Thin solid films (25.10.1993)
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Journal Article
Conference Proceeding
Extreme ultraviolet reflectors with metal-oxide multilayered structures
Delaboudiniere, J P, Vien, T K, Stehle, J L, Bernstein, P, Nevot, L
Published in Applied optics (2004) (15.04.1986)
Published in Applied optics (2004) (15.04.1986)
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Journal Article
Atomic scale characterization of semiconductors by in-situ real time spectroscopic ellipsometry
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Journal Article
Conference Proceeding