Femtosecond laser preparation of resin embedded samples for correlative microscopy workflows in life sciences
Bosch, Carles, Lindenau, Joerg, Pacureanu, Alexandra, Peddie, Christopher J., Majkut, Marta, Douglas, Andrew C., Carzaniga, Raffaella, Rack, Alexander, Collinson, Lucy, Schaefer, Andreas T., Stegmann, Heiko
Published in Applied physics letters (03.04.2023)
Published in Applied physics letters (03.04.2023)
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Journal Article
Consideration of a Ga-FIB in Lamella Sample Prep for EBIC Analysis of Advanced-node SRAMs
Johnson, Gregory M., Rummel, Andreas, Stegmann, Heiko, Hartfield, Cheryl
Published in 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (13.05.2024)
Published in 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (13.05.2024)
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Conference Proceeding
In-situ measurement of depletion zones in power devices
Johnson, Greg M., Rummel, Andreas, Stegmann, Heiko, Huang, Chengliang
Published in 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2023)
Published in 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2023)
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Conference Proceeding
하전 입자 빔 시스템 및 방법
VOLKENANDT TOBIAS, PAVIA GIUSEPPE, STEGMANN HEIKO, CHRISTIAN MULLER CHRISTIAN, DONHAUSER DANIELA, PREIKSZAS DIRK, CHAMLEY BARRY
Year of Publication 10.10.2019
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Year of Publication 10.10.2019
Patent
2B1400 modeling of F-actin
Oda, T., Makino, K., Hasegawa, K., Stegmann, Heiko, Schroder, Rasmus, Namba, K., Maeda, Y.
Published in Seibutsu Butsuri (10.10.2002)
Published in Seibutsu Butsuri (10.10.2002)
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Journal Article
In-situ EBIC measurements of IGBT during device turn-on
Johnson, Greg M., Rummel, Andreas, Stegmann, Heiko
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
Published in 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (24.07.2023)
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Conference Proceeding