Perpendicular-current transport in exchange-biased spin-valves
Pratt, W.P., Steenwyk, S.D., Hsu, S.Y., Chiang, W.-C., Schaefer, A.C., Loloee, R., Bass, J.
Published in IEEE transactions on magnetics (01.09.1997)
Published in IEEE transactions on magnetics (01.09.1997)
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Journal Article
Fabrication and total dose testing of a 256 K1 radiation-hardened SRAM
Kushner, R.A., Kohler, R.A., Steenwyk, S.D., Desko, J.C., Alchesky, L.C., Arnold, R.H., Benevit, C.A., Clemons, D.G., Longfellow, D.A., Lee, K.H., Flores, R.S.
Published in IEEE transactions on nuclear science (01.12.1988)
Published in IEEE transactions on nuclear science (01.12.1988)
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Journal Article
Selective tungsten on aluminum for improved VLSI interconnects
Hey, H.P.W., Sinha, A.K., Steenwyk, S.D., Rana, V.V.S., Yeh, J.L.
Published in 1986 International Electron Devices Meeting (1986)
Published in 1986 International Electron Devices Meeting (1986)
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Conference Proceeding
Scaling studies of CMOS SRAM soft-error tolerances - From 16K to 256K
Fu, J.S., Lee, K.H., Koga, R., Hewlett, F.W., Flores, R., Anderson, R.E., Desko, J.C., Nagy, W.J., Shimer, J.A., Kohler, R.A., Steenwyk, S.D.
Published in 1987 International Electron Devices Meeting (1987)
Published in 1987 International Electron Devices Meeting (1987)
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Conference Proceeding