Induced Voltage and Current Simulations, Safety Criterion, and Mitigation for EHV Transmission Lines in Close Proximity
Wu, Xuan, Meisner, David J., Stechschulte, Kyle D., Simha, Vinod, Wellman, Ronald J., Thakur, Manish, Posey, Kenneth R., Dimpfl, Scott S.
Published in IEEE transactions on industry applications (01.05.2019)
Published in IEEE transactions on industry applications (01.05.2019)
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Journal Article
Induced Voltage & Current Simulations, Safety Criterion, and Mitigations for EHV Transmission Lines in Close Proximity
Wu, Xuan, Meisner, David J., Stechschulte, Kyle D., Simha, Vinod, Wellman, Ronald J., Thakur, Manish, Posey, Kenneth R.
Published in 2018 IEEE Industry Applications Society Annual Meeting (IAS) (01.09.2018)
Published in 2018 IEEE Industry Applications Society Annual Meeting (IAS) (01.09.2018)
Get full text
Conference Proceeding