by Stathis, J.H., Zafar, S.
Published in Microelectronics and reliability (01.02.2006)

by Stathis, J.H., Wang, M., Zhao, K.
Published in Microelectronics and reliability (01.09.2010)

by Rodriguez, R., Stathis, J.H., Linder, B.P.
Published in IEEE electron device letters (01.02.2003)

by Lombardo, S, Stathis, J H, Linder, B P
Published in Physical review letters (25.04.2003)

by Rodriguez, R., Stathis, J.H., Linder, B.P., Kowalczyk, S., Chuang, C.T., Joshi, R.V., Northrop, G., Bernstein, K., Bhavnagarwala, A.J., Lombardo, S.
Published in IEEE electron device letters (01.09.2002)

by Linder, B.P., Stathis, J.H.
Published in Microelectronic engineering (01.04.2004)

by Stathis, J.H., Bolam, R., Yang, M., Hook, T.B., Chou, A., Larosa, G.
Published in Microelectronic engineering (01.06.2005)

by Rodrı́guez, R, Stathis, J.H, Linder, B.P
Published in Microelectronic engineering (01.04.2004)

by Stathis, J H
Published in IBM journal of research and development (01.03.2002)

by Stathis, J. H.
Published in IBM journal of research and development (01.03.2002)

by Palumbo, F., Lombardo, S., Stathis, J.H., Narayanan, V., McFeely, F.R., Yurkas, J.J.
Published in Microelectronic engineering (01.04.2004)

by Stathis, J.H., DiMaria, D.J.
Published in Microelectronic engineering (1999)

by Stathis, J.H., LaRosa, G., Chou, A.
Published in 2004 IEEE International Reliability Physics Symposium. Proceedings (2004)

by Min Yang, Chan, V.W.C., Chan, K.K., Shi, L., Fried, D.M., Stathis, J.H., Chou, A.I., Gusev, E., Ott, J.A., Burns, L.E., Fischetti, M.V., Meikei Ieong
Published in IEEE transactions on electron devices (01.05.2006)

by Zhao, K, Stathis, J H, Kerber, A, Cartier, E
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)

by Zhao, K, Stathis, J H, Linder, B P, Cartier, E, Kerber, A
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by AMAT, E, RODRIGUEZ, R, NAFRIA, M, AYMERICH, X, STATHIS, J. H
Published in Microelectronics and reliability (01.04.2007)

by Chang, W L, Stathis, J H, Cartier, E
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)

by Linder, B.P., Lombardo, S., Stathis, J.H., Vayshenker, A., Frank, D.J.
Published in IEEE electron device letters (01.11.2002)

by CARTIER, E, BUCHANAN, D. A, STATHIS, J. H, DIMARIA, D. J
Published in Journal of non-crystalline solids (01.07.1995)