The Design and First Results of a Dedicated Corrector (S)TEM
Stam, M A van der, Tiemeijer, P, Freitag, B, Stekelenburg, M, Ringnalda, J
Published in Microscopy and microanalysis (01.08.2005)
Published in Microscopy and microanalysis (01.08.2005)
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Journal Article
Design Advances and New Results of a Sub-Ångström Dedicated Corrector S/TEM
Stam, M Van der, Freitag, B, Erni, R, Tiemeijer, P, Stekelenburg, M, Hubert, D, Ringnalda, J
Published in Microscopy and microanalysis (01.08.2006)
Published in Microscopy and microanalysis (01.08.2006)
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Journal Article