Raman fingerprints of different vanadium oxides as impurity phases in VO2 films
Dzhagan, V.M., Valakh, M. Ya, Isaieva, O.F., Yukhymchuk, V.O., Stadnik, O.A., Gudymenko, O. Yo, Lytvyn, P.M., Kulbachynskyi, O.A., Yefanov, V.S., Romanyuk, B.M., Melnik, V.P.
Published in Optical materials (01.02.2024)
Published in Optical materials (01.02.2024)
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Journal Article
Study of fractality nature in VO2 films and its influence on metal-insulator phase transition
Efremov, A.A., Romaniuk, B.M., Melnyk, V.P., Stadnik, O.A., Sabov, T.M., Kulbachinskiy, O.A., Dubikovskiy, O.V.
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.01.2024)
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.01.2024)
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Journal Article
Nanomechanical properties of polycrystalline vanadium oxide thin films of different phase composition
Lytvyn, P.M., Dzhagan, V.M., Valakh, M.Ya, Korchovyi, A.A., Isaieva, O.F., Stadnik, O.A., Kulbachynskyi, O.A., Gudymenko, O.Yo, Romanyuk, B.M., Melnik, V.P.
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.01.2023)
Published in Semiconductor physics, quantum electronics, and optoelectronics (01.01.2023)
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Journal Article
Surface electronic states in the fundamental gap of the clean and group III–V doped Si(110) surface
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