An Insight Into Self-Heating Effects and Its Implications on Hot Carrier Degradation for Silicon-Nanotube-Based Double Gate-All-Around (DGAA) MOSFETs
Kumar, Arun, Srinivas, P. S. T. N., Tiwari, Pramod Kumar
Published in IEEE journal of the Electron Devices Society (2019)
Published in IEEE journal of the Electron Devices Society (2019)
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Journal Article
Physical Insight into Self-heating Induced Performance Degradation in RingFET
Singh, Sahil, Srinivas, P. S. T. N., Kumar, Arun, Tiwari, Pramod Kumar
Published in SILICON (01.08.2022)
Published in SILICON (01.08.2022)
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Journal Article
Back Bias Induced Modeling of Subthreshold Characteristics of SOI Junctionless Field Effect Transistor (JLFET)
Dixit, Vijay Kumar, Gupta, Rajeev, Srinivas, P S T N, Dubey, Sarvesh
Published in SILICON (01.06.2021)
Published in SILICON (01.06.2021)
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Juvenile scleredema of Buschke
Rani, J Dhanuja, Patil, Suneel G, Murthy, S T Srinivas, Koshy, Ajit V, Nagpal, Deepak, Gupta, Sheeba
Published in The journal of contemporary dental practice (2012)
Published in The journal of contemporary dental practice (2012)
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Leveraging blockchain technology for resilient and robust frequency control in a renewable-based hybrid power system with hydrogen and battery storage integration
Loka, Renuka, Parimi, Alivelu M., Srinivas, S.T.P., Manoj Kumar, Nallapaneni
Published in Energy conversion and management (01.05.2023)
Published in Energy conversion and management (01.05.2023)
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