Prolonged 500 °C Demonstration of 4H-SiC JFET ICs With Two-Level Interconnect
Spry, David J., Neudeck, Philip G., Liangyu Chen, Lukco, Dorothy, Chang, Carl W., Beheim, Glenn M.
Published in IEEE electron device letters (01.05.2016)
Published in IEEE electron device letters (01.05.2016)
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Journal Article
Early Burn-In Parasitic Conduction in 500 °C Durable SiC JFET ICs
Chen, Liang Yu, Neudeck, Philip G., Lukco, Dorothy, Spry, David J.
Published in Key engineering materials (06.06.2023)
Published in Key engineering materials (06.06.2023)
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Journal Article
Optimization of TaSi2 Processing for 500 °C Durable SiC JFET-R Integrated Circuits
Rajgopal, Srihari, Neudeck, Philip G., Spry, David J., Chang, Carl W., Gonzalez, Jose M.
Published in Key engineering materials (06.06.2023)
Published in Key engineering materials (06.06.2023)
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Journal Article
Guidelines for the diagnosis and antibiotic treatment of endocarditis in adults: a report of the Working Party of the British Society for Antimicrobial Chemotherapy
Gould, F. K., Denning, D. W., Elliott, T. S. J., Foweraker, J., Perry, J. D., Prendergast, B. D., Sandoe, J. A. T., Spry, M. J., Watkin, R. W.
Published in Journal of antimicrobial chemotherapy (01.05.2012)
Published in Journal of antimicrobial chemotherapy (01.05.2012)
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Journal Article
Critical issues and alternatives for the establishment of chemical water quality criteria for livestock
Valente-Campos, Simone, Spry, Douglas J., Pascale Palhares, Julio Cesar, Jakomin Rudez, Luz Marina, Umbuzeiro, Gisela de Aragão
Published in Regulatory toxicology and pharmacology (01.06.2019)
Published in Regulatory toxicology and pharmacology (01.06.2019)
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Journal Article
Experimental and Theoretical Study of 4H-SiC JFET Threshold Voltage Body Bias Effect from 25 °C to 500 °C
Chen, Liang Yu, Spry, David J., Neudeck, Philip G.
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
Stable Electrical Operation of 6H-SiC JFETs and ICs for Thousands of Hours at 500 °C
NEUDECK, Philip G, SPRY, David J, PROKOP, Norman F, CHEN, Liang-Yu, BEHEIM, Glenn M, OKOJIE, Robert S, CHANG, Carl W, MEREDITH, Roger D, FERRIER, Terry L, EVANS, Laura J, KRASOWSKI, Michael J
Published in IEEE electron device letters (01.05.2008)
Published in IEEE electron device letters (01.05.2008)
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Journal Article
Prolonged 500°C Operation of 100+ Transistor Silicon Carbide Integrated Circuits
Krasowski, Michael, Chang, Carl W., Neudeck, Philip G., Beheim, Glenn M., Prokop, Norman F., Chen, Liang Yu, Spry, David J., Lukco, Dorothy
Published in Materials science forum (05.06.2018)
Published in Materials science forum (05.06.2018)
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Journal Article
New guidelines for prevention and management of implantable cardiac electronic device-related infection
Sandoe, Jonathan A T, Barlow, Gavin, Chambers, John B, Gammage, Michael, Guleri, Achyut, Howard, Philip, Olson, Ewan, Perry, John D, Prendergast, Bernard D, Spry, Michael J, Steeds, Richard P, Tayebjee, Muzahir H, Watkin, Richard
Published in The Lancet (British edition) (06.06.2015)
Published in The Lancet (British edition) (06.06.2015)
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