Oxide Reliability of Gate Biased Trench Si-IGBTs Irradiated with Protons and Neutrons
Spejo, Lucas B., Rehm, Silvan, Novak, Vladimir, Ammann, Benedict, Wursch, Philippe, Stark, Roger, Knoll, Lars, Schulz, Nicola, Minamisawa, Renato A.
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
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Conference Proceeding
Energy saving potential of WBG-commercial power converters in different applications
Spejo, Lucas B., Nonis, Erik, Schulz, Nicola, Minamisawa, Renato A.
Published in 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) (04.09.2023)
Published in 2023 25th European Conference on Power Electronics and Applications (EPE'23 ECCE Europe) (04.09.2023)
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Conference Proceeding
Interface Trap Density of Commercial 1.7 kV SiC Power MOSFETs
Spejo, Lucas B., Lucidi, Samuel, Puydinger Dos Santos, Marcos V., Diniz, Jose A., Minamisawa, Renato A.
Published in 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) (28.08.2023)
Published in 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro) (28.08.2023)
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Conference Proceeding
Development of a double pulse test plataform for switching loss investigation in emerging SiC MOSFET technology
Silva, Denison Rodrigo Ferreira, Guerreiro, Joel Felipe, Spejo, Lucas B., Puydinger Dos Santos, Marcos V.
Published in 2024 38th Symposium on Microelectronics Technology and Devices (SBMicro) (02.09.2024)
Published in 2024 38th Symposium on Microelectronics Technology and Devices (SBMicro) (02.09.2024)
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Conference Proceeding