SERDES external loopback test using production parametric-test hardware
Arora, Shalini, Aflaki, Aman, Biswas, Sounil, Shimanouchi, Masashi
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
Published in 2016 IEEE International Test Conference (ITC) (01.11.2016)
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Conference Proceeding
Innovative practices session 5C: Machine learning and data analysis in test
Biswas, Sounil, Carulli, John, Drmanac, Dragoljub Gagi, Bhattacherjee, Arpan
Published in 2014 IEEE 32nd VLSI Test Symposium (VTS) (01.04.2014)
Published in 2014 IEEE 32nd VLSI Test Symposium (VTS) (01.04.2014)
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Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data
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Maintaining Accuracy of Test Compaction through Adaptive Re-learning
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Improving the Accuracy of Test Compaction through Adaptive Test Update
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Conference Proceeding
Specification Test Compaction for Analog Circuits and MEMS
Biswas, Sounil, Li, Peng, Blanton, R. D. (Shawn), Pileggi, Larry T.
Published in Design, Automation and Test in Europe (07.03.2005)
Published in Design, Automation and Test in Europe (07.03.2005)
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Generalized sensitization using fault tuples
Biswas, S., Dwarakanath, K.N., Blanton, R.D.
Published in 22nd IEEE VLSI Test Symposium, 2004. Proceedings (2004)
Published in 22nd IEEE VLSI Test Symposium, 2004. Proceedings (2004)
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