by Zelsacher, R., Wood, A.C.G., Bacher, E., Prax, E., Sorschag, K., Krumrey, J., Baumgartl, J.
Published in Microelectronics and reliability (01.09.2007)

by Sorschag, K., Gold, H., Lutz, J., Kuchar, F., Pippan, M., Noll, H.
Published in Applied physics. A, Materials science & processing (01.03.1998)

by Rupp, T., Dyroff, N., Gaertner, T., Gross, T., Gruber, H., Neidhart, T., Peri, H., Riss, J., Schagerl, G., Stefaner, A., Sorschag, K., Danzfuss, B., Domes, H., Gatterbauer, J., Geiger, H., Kaspar, J., Komposch, A., Leicht, M., Mayer, B., Muehlbacher, K.H., Pairitsch, H., Rogge, W., Simmnacher, B., Steinacher, S., Trieblnig, E., Wald, G., Weber, K., Wiebauer, W., Wiesinger, K., Henoeckl, A.
Published in 2004 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (IEEE Cat. No.04CH37530) (2004)