BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel
JANG, Young-Chan, CHUNG, Hoeju, LEE, Yun-Sang, KIM, Woo-Seop, LEE, Jung-Bae, YOO, Jeihwan, KIM, Changhyun, CHOI, Youngdon, PARK, Hwanwook, KIM, Jaekwan, LIM, Soouk, SUNWOO, Jung, PARK, Moon-Sook, KIM, Hyung-Seuk, KIM, Sang-Yun
Published in IEEE journal of solid-state circuits (01.11.2009)
Published in IEEE journal of solid-state circuits (01.11.2009)
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Journal Article
Conference Proceeding
Channel BER Measurement for a 5.8Gb/s/pin unidirectional differential I/O for DRAM application
Hoeju Chung, Youngchan Jang, Youngdon Choi, Hwanwook Park, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Moonsook Park, Hyungwsuk Kim, Sang-Yun Kim, Hyun-Kyung Kim, Su-Jin Chung, Eun-Mi Lee, Youngju Kim, Yun-Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Changhyun Kim
Published in 2008 IEEE Asian Solid-State Circuits Conference (01.11.2008)
Published in 2008 IEEE Asian Solid-State Circuits Conference (01.11.2008)
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Conference Proceeding