A Novel Cooling System to Reduce Thermally-Induced Errors of Machine Tools
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Information Model for Machine-Tool-Performance Tests
Lee, Y T, Soons, J A, Donmez, M A
Published in Journal of research of the National Institute of Standards and Technology (01.03.2001)
Published in Journal of research of the National Institute of Standards and Technology (01.03.2001)
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Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
Real, M. A., Lass, E. A., Fan-Hung Liu, Shen, T., Jones, G. R., Soons, J. A., Newell, D. B., Davydov, A. V., Elmquist, R. E.
Published in IEEE transactions on instrumentation and measurement (01.06.2013)
Published in IEEE transactions on instrumentation and measurement (01.06.2013)
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A General Method for Error Description of CMMs Using Polynomial Fitting Procedures
Teeuwsen, J.W.M.C., Soons, J.A., Schellekens, P.H.J., van der Wolf, A.C.H.
Published in CIRP annals (1989)
Published in CIRP annals (1989)
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Graphene Epitaxial growth on SiC(0001) for resistance standards
Real, M. A., Shen, T., Jones, G. R., Elmquist, R. E., Soons, J. A., Davydov, A. V.
Published in 2012 Conference on Precision electromagnetic Measurements (01.07.2012)
Published in 2012 Conference on Precision electromagnetic Measurements (01.07.2012)
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