Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET
Wan Muhamad Hatta, S.F., Hussin, H., Soon, F.Y., Wahab, Y. Abdul, Hadi, D. Abdul, Soin, N., Zahirul Alam, A.H.M., Nordin, A.N.
Published in 2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE) (01.04.2017)
Published in 2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE) (01.04.2017)
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