Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films
Cao, Jiang-Li, Solbach, Axel, Klemradt, Uwe, Weirich, Thomas, Mayer, Joachim, Böttger, Ulrich, Ellerkmann, Ulrich, Schorn, Peter J., Gerber, Peter, Waser, Rainer
Published in Journal of the American Ceramic Society (01.04.2006)
Published in Journal of the American Ceramic Society (01.04.2006)
Get full text
Journal Article
X-ray reflectivity studies of ferroelectric and dielectric multilayer structures
Get full text
Journal Article
Conference Proceeding