Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM
Boruzdina, Anna B., Sogoyan, Armen V., Smolin, Anatoly A., Ulanova, Anastasia V., Gorbunov, Maxim S., Chumakov, Alexander I., Boychenko, Dmitry V.
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Single event effects qualificatoin of integrated circuits
Sogoyan, Armen V., Smolin, Anatoly A., Chumakov, Alexander I.
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
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Journal Article
The influence of high ionizing dose rate on CMOS IC radiation hardness used in da-ta transmission elements
Kalashnikov, Vladislav D., Egorov, Alexey Yu, Sogoyan, Armen V., Ulanova, Anastasia V., Karakozov, Andrey B., Balamutov, Pavel A.
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.09.2020)
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.09.2020)
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Journal Article
Some aspects of IC radiation hardness evaluation when exposed to neutrons
Chumakov, Alexander I., Sogoyan, Armen V., Bobrovsky, Dmitry V., Titovets, Dmitry O., Chumakov, Konstantin A., Diankov, Sergey Y., Khaustov, Vitaly V., Gerasimchuk, Oleg A., Yurkov, Dmitry I.
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.04.2021)
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.04.2021)
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Journal Article
Hardness assurance levels and requirements for single event effects testing of integrated circuits
Chumakov, Alexander I., Sogoyan, Armen V., Smolin, Anatoly A., Ahmetov, Alexey O., Bobrovsky, Dmitry V., Boychenko, Dmitry V., Ryasnoy, Nikolai V., Chumakov, Konstantin A., Churilin, Evgeny V., Gerasimov, Vladimir F., Khaustov, Vitaly V., Sashov, Alexander A., Ulanova, Anastasia V., Yanenko, Andrey V.
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
Published in Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ (01.03.2020)
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Journal Article
Application of effective LET approach for modern CMOS devices
Akhmetov, Alexey O., Bobrovsky, Dmitriy V., Smolin, Anatoly A., Chumakov, Alexander I., Sogoyan, Armen V.
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
Published in 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2019)
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Conference Proceeding
Two-Parameter Model for SEE Rate Estimation
Smolin, Anatoly A., Sogoyan, Armen V., Chumakov, Alexander I.
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
Published in 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2018)
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Conference Proceeding
A simple analytical model of single-event upsets in bulk CMOS
Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A., Ulanova, Anastasia V., Boruzdina, Anna B.
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.06.2017)
Published in Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (01.06.2017)
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Journal Article
Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation
Smolin, Anatoly A., Sogoyan, Armen V., Ulanova, Anastasia V., Demidov, Alexander A.
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
Multiple Cell Upset Mechanisms in SRAMs
Chumakov, Alexander I., Sogoyan, Armen V., Boruzdina, Anna B., Smolin, Anatoly A., Pechenkin, Alexander A.
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
The Experimental and Simulation Study of Specialized Thermal Control Coating Application for Radiation Shielding of Electronic Components
Anashin, Vasily S., Protopopov, Grigory A., Kozyukova, Olga S., Lyakhov, Igor A., Zinchenko, Vladimir F., Grigorevskiy, Anatoly V., Khasanshin, Rashid H., Sogoyan, Armen V.
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
Published in 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2015)
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Conference Proceeding
Method for integrated circuits total ionizing dose hardness testing based on combined gamma- and x-ray irradiation facilities
Sogoyan, Armen, Artamonov, Alexey, Nikiforov, Alexander, Boychenko, Dmitry
Published in Facta universitatis. Series Electronics and energetics (01.09.2014)
Published in Facta universitatis. Series Electronics and energetics (01.09.2014)
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Journal Article
Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation
Kessarinskiy, Leonid N., Boychenko, Dmitry V., Petrov, Andrey G., Nekrasov, Pavel V., Sogoyan, Armen V., Anashin, Vasily S., Chubunov, Pavel A.
Published in 2014 IEEE Radiation Effects Data Workshop (REDW) (01.07.2014)
Published in 2014 IEEE Radiation Effects Data Workshop (REDW) (01.07.2014)
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Conference Proceeding
Compendium of SEE comparative results under ion and laser irradiation
Chumakov, Alexander I., Pechenkin, Alexander A., Savchenkov, Dmitry V., Yanenko, Andrey V., Kessarinskiy, Leonid N., Nekrasov, Pavel V., Sogoyan, Armen V., Tararaksin, Alexander I., Vasil'ev, Alexey L., Anashin, Vasily S., Chubunov, Pavel A.
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
Published in 2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (01.09.2013)
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Conference Proceeding