Extraction of Sheet Resistance and Line Width From All-Copper ECD Test Structures Fabricated From Silicon Preforms
Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A., Smith, S., Snell, A.J., Stevenson, J., Walton, A.J., Allen, R., Cresswell, M.W.
Published in IEEE transactions on semiconductor manufacturing (01.11.2008)
Published in IEEE transactions on semiconductor manufacturing (01.11.2008)
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Conference Proceeding
AC characteristics of Cr/p/sup +/a-Si:H/V analog switching devices
Hu, J., Hajto, J., Snell, A.J., Rose, M.J.
Published in IEEE transactions on electron devices (01.09.2000)
Published in IEEE transactions on electron devices (01.09.2000)
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Journal Article
AC characteristics of Cr/p+a-Si:H/V analog switching devices
Hu, J, Hajto, J, Snell, A.J, Rose, M.J
Published in IEEE transactions on electron devices (01.09.2000)
Published in IEEE transactions on electron devices (01.09.2000)
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Journal Article
Investigation of durability of Cr-p +a-Si:H–V film memory devices
Hu, J, Snell, A.J, Hajto, J, Rose, M.J, Edmiston, W
Published in Journal of non-crystalline solids (01.05.2000)
Published in Journal of non-crystalline solids (01.05.2000)
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Journal Article
DC and ac measurements on metal/a-Si:H/metal room temperature quantised resistance devices
Hajto, J, Hu, J, Snell, A.J, Turvey, K, Rose, M
Published in Journal of non-crystalline solids (01.05.2000)
Published in Journal of non-crystalline solids (01.05.2000)
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Journal Article
Extraction of Sheet Resistance and Linewidth from All-Copper ECD Test Structures Fabricated from Silicon Preforms
Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Smith, S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
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Conference Proceeding
Array Based Test Structure for Optical-Electrical Overlay Calibration
Shulver, B.J.R., Allen, R.A., Walton, A.J., Cresswell, M.W., Stevenson, J.T.M., Smith, S., Bunting, A.S., Dunare, C., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)
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Conference Proceeding
Design and fabrication of a copper test structure for use as an electrical critical dimension reference
Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)
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Conference Proceeding
Theory of room temperature quantized resistance effects in metal-a-Si:H-metal thin film structures
Hajto, J., McAuley, B., Snell, A.J., Owen, A.E.
Published in Journal of non-crystalline solids (01.05.1996)
Published in Journal of non-crystalline solids (01.05.1996)
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Journal Article
Theory of room temperature quantized resistance steps in electroformed metal-a-Si:H-metal structures
Hajto, J., McAuley, B., Snell, A.J., Milburn, G.H.W., Owen, A.E.
Published in Applied surface science (01.02.1996)
Published in Applied surface science (01.02.1996)
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Use of a-Si:H memory devices for non-volatile weight storage in artificial neural networks
Holmes, A.J., Gibson, R.A.G., Hajto, J., Murray, A.F., Owen, A.E., Rose, M.J., Snell, A.J.
Published in Journal of non-crystalline solids (02.12.1993)
Published in Journal of non-crystalline solids (02.12.1993)
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Journal Article
DC and AC measurements on metal/a-Si:H/metal thin film devices
Hajto, J., Snell, A.J., Hu, J., Holmes, A., Owen, A.E., Rose, M.J., Gibson, R.A.G.
Published in Journal of non-crystalline solids (02.12.1993)
Published in Journal of non-crystalline solids (02.12.1993)
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Journal Article
The application of vanadium-doped SiO2 to eeprom devices
Snell, A.J., Delima, J.J., Krishna, K.V., Owen, A.E.
Published in Applied surface science (01.10.1989)
Published in Applied surface science (01.10.1989)
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Electronic switching in amorphous silicon devices: properties of the conducting filament
Owen, A.E., Hu, J., Hajto, J., Snell, A.J.
Published in 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) (1998)
Published in 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) (1998)
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