GaN MIS-HEMTs in Repetitive Overvoltage Switching: Parametric Shift and Recovery
Song, Qihao, Kozak, Joseph P., Ma, Yunwei, Liu, Jingcun, Zhang, Ruizhe, Volkov, Roman, Sherman, Daniel, Smith, Kurt V., Saito, Wataru, Zhang, Yuhao
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Get full text
Conference Proceeding
Interfacial differences in enhanced schottky barrier height Au/n-GaAs diodes deposited at 77K
Herrero, Andrew M., Gerger, A.M., Gila, B.P., Pearton, S.J., Wang, Hung-Ta, Jang, S., Anderson, T., Chen, J.J., Kang, B.S., Ren, F., Shen, H., LaRoche, Jeffrey R., Smith, Kurt V.
Published in Applied surface science (01.01.2007)
Published in Applied surface science (01.01.2007)
Get full text
Journal Article
GaN technology for microwave and millimeter wave applications
Kolias, Nicholas J, Whelan, Colin S, Kazior, Thomas E, Smith, Kurt V
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
Get full text
Conference Proceeding
Thermal Stability of Au Schottky Diodes on GaAs Deposited at Either 77 or 300 K
Wang, Hung-Ta, Kang, B. S., Ren, F., Herrero, A., Gerger, A. M., Gila, B. P., Pearton, S. J., Shen, H., LaRoche, Jeffery R., Smith, Kurt V.
Published in Journal of the Electrochemical Society (2006)
Published in Journal of the Electrochemical Society (2006)
Get full text
Journal Article
Interfacial differences in enhanced schottky barrier height Au/n-GaAs diodes deposited at 77 K
Herrero, Andrew M., Gerger, A.M., Gila, B.P., Pearton, S.J., Wang, Hung-Ta, Jang, S., Anderson, T., Chen, J.J., Kang, B.S., Ren, F., Shen, H., LaRoche, Jeffrey R., Smith, Kurt V.
Published in Applied surface science (15.01.2007)
Published in Applied surface science (15.01.2007)
Get full text
Journal Article
GaN technology for microwave and millimeter wave applications
Kolias, N. J., Whelan, C. S., Kazior, T. E., Smith, K. V.
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
Published in 2010 IEEE MTT-S International Microwave Symposium (01.05.2010)
Get full text
Conference Proceeding
GaN HEMT Reliability Through the Decade
Smith, Kurt V., Brierley, Steve, McAnulty, Robert, Tilas, Cary, Zarkh, Dimitry, Benedek, Michael, Phalon, Philip, Hooven, Anna
Published in ECS transactions (15.05.2009)
Published in ECS transactions (15.05.2009)
Get full text
Journal Article