IC test structures for multilayer interconnect stress determination
Smee, S.A., Gaitan, M., Novotny, D.B., Joshi, Y., Blackburn, D.L.
Published in IEEE electron device letters (01.01.2000)
Published in IEEE electron device letters (01.01.2000)
Get full text
Journal Article
MACS low-background doubly focusing neutron monochromator
Smee, S.A., Orndorff, J.D., Scharfstein, G.A., Qiu, Y., Brand, P.C., Broholm, C.L., Anand, D.K.
Published in Applied physics. A, Materials science & processing (01.12.2002)
Published in Applied physics. A, Materials science & processing (01.12.2002)
Get full text
Journal Article