Hole trap effect on time-dependent-dielectric breakdown (TDDB) of high-voltage peripheral nMOSFETs in flash memory application
Guangfan Jiao, Sungkweon Baek, Kab-jin Nam, Sung-Il Chang, Siyeon Cho, Kauerauf, Thomas, Chanho Lee, Seung-Uk Han, Jin-Soak Kim, Eun-Ae Chung, Yoo-Cheol Shin, Junhee Lim, Yu-Gyun Shin, Kihyun Hwang
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Published in 2017 IEEE International Reliability Physics Symposium (IRPS) (01.04.2017)
Get full text
Conference Proceeding
SEMICONDUCTOR MEMORY DEVICES
Kim, Taeyoung, Lee, Bongyong, Hayakawa, Yukio, Cho, Siyeon, Park, Hyunmog
Year of Publication 11.01.2024
Get full text
Year of Publication 11.01.2024
Patent
MAGNETIC MEMORY DEVICE AND METHOD OF OPERATING THE SAME
PARK, Hyunmog, CHO, Siyeon, KIM, Taeyoung, HAYAKAWA, Yukio, LEE, Bongyong
Year of Publication 14.09.2023
Get full text
Year of Publication 14.09.2023
Patent
SEMICONDUCTOR DEVICES AND DATA STORAGE SYSTEMS INCLUDING THE SAME
Kim, Taeyoung, Lee, Bongyong, Hayakawa, Yukio, Cho, Siyeon, Park, Hyunmog
Year of Publication 24.08.2023
Get full text
Year of Publication 24.08.2023
Patent
Three-dimensional semiconductor memory devices
Choi, Yusik, Shin, Hyeri, Hwang, Sungyung, Lee, Sung-Bok, Cho, Siyeon
Year of Publication 23.02.2021
Get full text
Year of Publication 23.02.2021
Patent
THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES
Choi, Yusik, Shin, Hyeri, Hwang, Sungyung, CHO, SIYEON, Lee, Sung-Bok
Year of Publication 18.06.2020
Get full text
Year of Publication 18.06.2020
Patent