Reliability issues of GaN based high voltage power devices
Wuerfl, J., Bahat-Treidel, E., Brunner, F., Cho, E., Hilt, O., Ivo, P., Knauer, A., Kurpas, P., Lossy, R., Schulz, M., Singwald, S., Weyers, M., Zhytnytska, R.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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