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Gas Hydrate Single-Crystal Structure Analyses
Kirchner, Michael T, Boese, Roland, Billups, W. Edward, Norman, Lewis R
Published in Journal of the American Chemical Society (04.08.2004)
Published in Journal of the American Chemical Society (04.08.2004)
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Physical–mathematical model of Lorentz factor for the integrated intensity of single crystal diffraction
Anghelina, Florina Violeta, Popescu, Ileana Nicoleta, Bratu, Vasile, Anghelina, Constantin C., Rusanescu, Carmen Otilia
Published in Computational materials science (01.11.2014)
Published in Computational materials science (01.11.2014)
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Crystallographic software for the new generation
Watkin, D., Cooper, R., Prout, C. K.
Published in Zeitschrift für Kristallographie. Crystalline materials (01.07.2002)
Published in Zeitschrift für Kristallographie. Crystalline materials (01.07.2002)
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Use of Image-Processing Tools for Texture Analysis of High-Energy X-ray Synchrotron Data
Fisker, R., Poulsen, H. F., Schou, J., Carstensen, J. M., Garbe, S.
Published in Journal of applied crystallography (01.10.1998)
Published in Journal of applied crystallography (01.10.1998)
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Investigation of inhomogeneous structures of near-surface-layers in ion-implanted silicon
Swiatek, Z, Bonarski, J.T, Ciach, R, Kuznicki, Z.T, Fodchuk, I.M, Raransky, M.D, Gorley, P
Published in Thin solid films (29.04.1998)
Published in Thin solid films (29.04.1998)
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Comparing Independently Determined Structures
Abrahams, S. C.
Published in Acta crystallographica. Section A, Foundations of crystallography (01.09.1997)
Published in Acta crystallographica. Section A, Foundations of crystallography (01.09.1997)
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