Search Results - "Singhal, Kumud" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

Predictive worst case statistical modeling of 0.8- mu m BICMOS bipolar transistors: a methodology based on process and mixed device/circuit level simulators

Predictive worst case statistical modeling of 0.8- mu m BICMOS bipolar transistors: a methodology based on process and mixed device/circuit level simulators

by Kizilyalli, I.C., Ham, T.E., Singhal, K., Kearney, J.W., Lin, W., Thoma, M.J.
Published in IEEE transactions on electron devices (01.05.1993)

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Journal Article

Deriving statistical device models from worst-case files

Deriving statistical device models from worst-case files

by SINGHAL KUMUD, VISVANATHAN V
Year of Publication 26.01.2001

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Patent

Inversion charge modeling

Inversion charge modeling

by Gummel, H.K., Singhal, K.
Published in IEEE transactions on electron devices (01.08.2001)

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Journal Article

Statistical device models from worst case files and electrical test data

Statistical device models from worst case files and electrical test data

by Singhal, K., Visvanathan, V.
Published in IEEE transactions on semiconductor manufacturing (01.11.1999)

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Journal Article Conference Proceeding

Intrinsic MOSFET capacitance coefficients

Intrinsic MOSFET capacitance coefficients

by Gummel, H.K., Singhal, K.
Published in IEEE transactions on electron devices (01.10.2001)

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Journal Article

Deriving statistical device models from electrical test data

Deriving statistical device models from electrical test data

by Singhal, Kumud, Visvanathan, V
Year of Publication 06.05.2003

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Patent

Deriving statistical device models from electrical test data

Deriving statistical device models from electrical test data

by SINGHAL KUMUD, VISVANATHAN V
Year of Publication 06.05.2003

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Patent

Deriving statistical device models from worst-case files

Deriving statistical device models from worst-case files

by VISVANATHAN, V, SINGHAL, KUMUD
Year of Publication 26.03.2003

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Patent

Deriving statistical device models from worst-case files

Deriving statistical device models from worst-case files

by Singhal, Kumud, Visvanathan, V
Year of Publication 12.03.2002

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Patent

Deriving statistical device models from worst-case files

Deriving statistical device models from worst-case files

by SINGHAL KUMUD, VISVANATHAN V
Year of Publication 12.03.2002

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Patent

Deriving statistical device models from worst-case files

Deriving statistical device models from worst-case files

by VISVANATHAN, V, SINGHAL, KUMUD
Year of Publication 11.03.2002

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Patent

METHOD FOR EXTRACTING STATISTICAL DEVICE MODEL FROM WORST-CASE FILE

METHOD FOR EXTRACTING STATISTICAL DEVICE MODEL FROM WORST-CASE FILE

by SINGHAL KUMUD, VISVANATHAN V
Year of Publication 30.11.2000

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Patent

Deriving statistical device models from worst-case files

Deriving statistical device models from worst-case files

by VISVANATHAN, V, SINGHAL, KUMUD
Year of Publication 18.10.2000

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Patent

Technology CAD at AT&T

Technology CAD at AT&T

by Lloyd, Peter, McAndrew, Colin C., McLennan, Michael J., Nassif, Sani R., Singhal, Kishore, Singhal, Kumud, Zeitzoff, Peter M., Darwish, Mohamed N., Haruta, Ken, Lentz, Janet L., Vuong, Hong-Ha, Pinto, Mark R., Rafferty, Conor S., Kizilyalli, Isik C.
Published in Microelectronics (01.03.1995)

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Journal Article