Innovative practices session 2C: New technologies, new challenges - 2
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Conference Proceeding
High sensitivity test signatures for unconventional analog circuit test paradigms
Sindia, Suraj, Agrawal, Vishwani D.
Published in 2013 IEEE International Test Conference (ITC) (01.09.2013)
Published in 2013 IEEE International Test Conference (ITC) (01.09.2013)
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Conference Proceeding
About the cover from the Publication Co-Chairs
Garimella, Annaji Row, Sindia, Suraj
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
Published in 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems (01.01.2014)
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Conference Proceeding
A Test Time Theorem and its Applications
Venkataramani, Praveen, Sindia, Suraj, Agrawal, Vishwani D.
Published in Journal of electronic testing (01.04.2014)
Published in Journal of electronic testing (01.04.2014)
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Journal Article
Defect Level and Fault Coverage in Coefficient Based Analog Circuit Testing
Sindia, Suraj, Agrawal, Vishwani D., Singh, Virendra
Published in Journal of electronic testing (01.08.2012)
Published in Journal of electronic testing (01.08.2012)
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Journal Article
Impact of process variations on computers used for image processing
Sindia, Suraj, Dai, Fa Foster, Agrawal, Vishwani D., Singh, Virendra
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
Published in 2012 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2012)
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Conference Proceeding
MobSched: Customizable scheduler for mobile cloud computing
Sindia, Suraj, Lim, Alvin S., Gao, Song, Agrawal, Vishwani, Black, Bobby, Agrawal, Prathima
Published in 45th Southeastern Symposium on System Theory (01.03.2013)
Published in 45th Southeastern Symposium on System Theory (01.03.2013)
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Conference Proceeding
Finding best voltage and frequency to shorten power-constrained test time
Venkataramani, P., Sindia, S., Agrawal, V. D.
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)
Published in 2013 IEEE 31st VLSI Test Symposium (VTS) (01.04.2013)
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Conference Proceeding
Test and Diagnosis of Analog Circuits Using Moment Generating Functions
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Conference Proceeding