A new edge termination technique to improve voltage blocking capability and reliability of field limiting ring for power devices
Yo Han Kim, Han Sin Lee, Sin Su Kyung, Young Mok Kim, Ey Goo Kang, Man Young Sung
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
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