by Kim, Insoo, Park, So Jeong, Jeong, Changwook, Shim, Munbo, Kim, Dae Sin, Kim, Gyu-Tae, Seok, Junhee
Published in Scientific reports (21.01.2022)

by Lee, Juho, Kim, Seunghyun, Kim, Hyoseok, Hong, Sungduk, Kim, Sung Jin, Sin Kim, Dae, Woo, Myung Hun, Heon Kang, Joo, Park, Hyun-Mog, Ha, Daewon
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)

by Tsuji, Yukihide, Kim, Doyun, Yoo, Gwangsu, Hwang, ByungHyun, Kim, Kwanghoon, Lee, Donhwan, Sasai, Yoshinori, Yi, Shinwook, Jeong, Jaehoon, Ihm, Dongchul, Jun, ChungSam, Kim, Dae Sin
Published in AIP advances (01.06.2021)

by Jin, Seonghoon, Lee, Kyungmin, Choi, Woosung, Park, Chulwoo, Yi, Shinwook, Fujii, Hiroki, Yoo, Jaehyun, Park, Yonghee, Jeong, Jaehoon, Kim, Dae Sin
Published in IEEE transactions on electron devices (01.03.2024)

by Jang, Wonik, Myung, Sanghoon, Choe, Jae Myung, Kim, Young-Gu, Kim, Dae Sin
Published in IEEE electron device letters (01.08.2023)

by Jeong, Changwook, Myung, Sanghoon, Huh, In, Choi, Byungseon, Kim, Jinwoo, Jang, Hyunjae, Lee, Hojoon, Park, Daeyoung, Lee, Kyuhun, Jang, Wonik, Ryu, Jisu, Cha, Moon-Hyun, Choe, Jae Myung, Shim, Munbo, Kim, Dae Sin
Published in IEEE transactions on electron devices (01.11.2021)

by Lee, Juho, Byeon, Seongjae, Kim, Seunghyun, Yoo, Sung-Won, Lee, Wonsok, Hong, Sungduk, Hee Cho, Min, Jin Kim, Sung, Ha, Daewon, Sin Kim, Dae
Published in IEEE electron device letters (01.09.2024)

by Bae, Jaehyun, Yoo, Gwangsu, Nakamura, Satoshi, Ohnishi, Shota, Kim, Dae Sin
Published in Quantum information processing (10.07.2024)

by Choi, Woon Ih, Son, Won‐Joon, Dronskowski, Richard, Oh, Youngtek, Yang, Seung‐Yeul, Kwon, Uihui, Kim, Dae Sin
Published in Advanced materials (Weinheim) (01.03.2024)

by Cho, Eunseog, Son, Won-Joon, Cho, Eunae, Jang, Inkook, Kim, Dae Sin, Min, Kyoungmin
Published in Scientific reports (10.10.2023)

by Park, Jae Hyeon, Suk, Chan Hee, Kim, Sungchul, Kim, Jae Ho, Kwon, Uihui, Kim, Dae Sin, Yoo, Keon-Ho, Kim, Tae Whan
Published in IEEE electron device letters (01.10.2022)

by Reitz, Linda S., Müller, Peter C., Schnieders, David, Dronskowski, Richard, Choi, Woon Ih, Son, Won‐Joon, Jang, Inkook, Kim, Dae Sin
Published in Journal of computational chemistry (15.04.2023)

by Ahn, Byungseong, Lee, Kwangseok, Yang, Jaehun, Doh, Jiseong, Jeong, Jaehoon, Kwag, Taeshin, Kim, Minseok, Kim, Yeonjeong, Kim, Jongchul, Keun Yoo, Hyung, Sin Kim, Dae
Published in Solid-state electronics (01.03.2023)

by Park, Jaehong, Shim, Youngseon, Lee, Franklin, Rammohan, Aravind, Goyal, Sushmit, Shim, Munbo, Jeong, Changwook, Kim, Dae Sin
Published in ACS polymers Au (10.08.2022)

by Kim, Inkoo, Cho, Kwang Hyun, Jeon, Soon Ok, Son, Won-Joon, Kim, Dongwook, Rhee, Young Min, Jang, Inkook, Choi, Hyeonho, Kim, Dae Sin
Published in JACS Au (26.07.2021)

by Shim, Youngseon, Shim, Munbo, Kim, Dae Sin
Published in Membranes (Basel) (21.04.2022)

by Park, Ji Young, Song, Hyun-Ji, Nguyen, Thanh Cuong, Son, Won-Joon, Kim, Daekeon, Song, Giyoung, Hong, Suk-Koo, Go, Heeyoung, Park, Changmin, Jang, Inkook, Kim, Dae Sin
Published in Molecules (Basel, Switzerland) (25.08.2023)

by Pourghaderi, M. Ali, Pham, Anh-Tuan, Park, Hong-Hyun, Jin, Seonghoon, Vuttivorakulchai, Kantawong, Park, Yonghee, Kwon, Uihui, Choi, Woosung, Kim, Dae Sin
Published in IEEE electron device letters (01.02.2022)

by Myung, Sanghoon, Choi, Byungseon, Jang, Wonik, Kim, Jinwoo, Huh, In, Choe, Jae Myung, Kim, Young-Gu, Kim, Dae Sin
Published in Japanese Journal of Applied Physics (01.04.2023)

by Ahn, Chihak, Jin, Seonghoon, Kang, Gijae, Jeon, Joohyun, Ahn, Hyoshin, Jang, Inkook, Choi, Woosung, Kim, Dae Sin
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)