Showing
1 - 13
results of
13
for search '
"Simovitch, Yariv"
'
Skip to content
Portal K.UTB
Čeština
Login
TBU Catalog
e-resources
E-THESES
All Fields
Title
Author
Subject
Find
Advanced Search
Search Results - "Simovitch, Yariv"
Showing
1 - 13
results of
13
for search '
"Simovitch, Yariv"
'
, query time: 0.59s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
1
Loading…
DIE-TO-MULTI-DIE WAFER INSPECTION
by
SIMOVITCH YARIV
,
ALMOG IDO
,
SHWARTZ GUY
,
NAFTALI RON
Year of Publication
13.04.2023
Get full text
Patent
Save to List
Saved in:
2
Loading…
COMPUTERIZED METHOD FOR CONFIGURING AN INSPECTION SYSTEM COMPUTER PROGRAM PRODUCT AND AN INSPECTION SYSTEM
by
SHOHAM AMIR
,
SIMOVITCH YARIV
,
DOLEV IDO
Year of Publication
11.10.2018
Get full text
Patent
Save to List
Saved in:
3
Loading…
Methods and systems for generating calibration data for wafer analysis
by
Simovitch
,
Yariv
Year of Publication
09.05.2023
Get full text
Patent
Save to List
Saved in:
4
Loading…
METHODS AND SYSTEMS FOR GENERATING CALIBRATION DATA FOR WAFER ANALYSIS
by
Simovitch
,
Yariv
Year of Publication
17.02.2022
Get full text
Patent
Save to List
Saved in:
5
Loading…
METHODS AND SYSTEMS FOR GENERATING CALIBRATION DATA FOR WAFER ANALYSIS
by
SIMOVITCH YARIV
Year of Publication
22.02.2022
Get full text
Patent
Save to List
Saved in:
6
Loading…
Die-to-multi-die wafer inspection
by
Simovitch
,
Yariv
,
Almog, Ido
,
Shwartz, Guy
,
Naftali, Ron
Year of Publication
31.10.2023
Get full text
Patent
Save to List
Saved in:
7
Loading…
DIE-TO-MULTI-DIE WAFER INSPECTION
by
Simovitch
,
Yariv
,
Almog, Ido
,
Shwartz, Guy
,
Naftali, Ron
Year of Publication
06.04.2023
Get full text
Patent
Save to List
Saved in:
8
Loading…
Computerized method for configuring an inspection system, computer program product and an inspection system
by
Simovitch
,
Yariv
,
Shoham, Amir
,
Dolev, Ido
Year of Publication
08.06.2021
Get full text
Patent
Save to List
Saved in:
9
Loading…
COMPUTERIZED METHOD FOR CONFIGURING AN INSPECTION SYSTEM, COMPUTER PROGRAM PRODUCT AND AN INSPECTION SYSTEM
by
Simovitch
,
Yariv
,
Shoham, Amir
,
Dolev, Ido
Year of Publication
04.10.2018
Get full text
Patent
Save to List
Saved in:
10
Loading…
Die-to-multi-die wafer inspection
by
SHWARTZ, GUY
,
SIMOVITCH
,
YARIV
,
NAFTALI, RON
,
ALMOG, IDO
Year of Publication
16.06.2023
Get full text
Patent
Save to List
Saved in:
11
Loading…
Computerized method for configuring an inspection system, computer program product and an inspection system
by
DOLEV, IDO
,
SHOHAM, AMIR
,
SIMOVITCH
,
YARIV
Year of Publication
11.10.2021
Get full text
Patent
Save to List
Saved in:
12
Loading…
Computerized method for configuring an inspection system, computer program product and an inspection system
by
DOLEV, IDO
,
SHOHAM, AMIR
,
SIMOVITCH
,
YARIV
Year of Publication
01.11.2018
Get full text
Patent
Save to List
Saved in:
13
Loading…
COMPUTERIZED METHOD FOR CONFIGURING INSPECTION SYSTEM, COMPUTER PROGRAM PRODUCT, AND AN INSPECTION SYSTEM
by
SHOHAM AMIR
,
SIMOVITCH YARIV
,
DOLEV IDO
Year of Publication
23.10.2018
Get full text
Patent
Save to List
Saved in:
RSS Feed
Email Search
Save Search
Search History
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit to articles from scholarly journals
Limit to articles with full text available
Limit to Open Access content
Exclude newspaper articles
Include articles at other libraries
Expand results using synonyms
Format
Patent
13 results
13
Subject Area
chemistry
13 results
13
medicine
13 results
13
physics
13 results
13
sciences
13 results
13
Topic
physics
13 results
13
measuring
12 results
12
testing
12 results
12
investigating or analysing materials by determining theirchemical or physical properties
11 results
11
calculating
8 results
8
computing
8 results
8
See more
Language
English
13 results
13
Chinese
5 results
5
Korean
2 results
2
Year of Publication
From:
To:
Database
esp@cenet
13 results
13
