Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS2 Transistor
Lee, Kookjin, Choi, Junhee, Kaczer, Ben, Grill, Alexander, Lee, Jae Woo, Van Beek, Simon, Bury, Erik, Diaz‐Fortuny, Javier, Chasin, Adrian, Lee, Jaewoo, Chun, Jungu, Shin, Dong Hoon, Na, Junhong, Cho, Hyeran, Lee, Sang Wook, Kim, Gyu‐Tae
Published in Advanced functional materials (01.06.2021)
Published in Advanced functional materials (01.06.2021)
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Journal Article
MTJ degradation in multi-pillar SOT-MRAM with selective writing
Van Beek, Simon, Cai, Kaiming, Fan, Kaiquan, Talmelli, Giacomo, Trovato, Anna, Jossart, Nico, Rao, Siddharth, Chasin, Adrian, Couet, Sebastien
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Experimental Observation of Back-Hopping With Reference Layer Flipping by High-Voltage Pulse in Perpendicular Magnetic Tunnel Junctions
Woojin Kim, Couet, Sebastien, Swerts, Johan, Tsann Lin, Tomczak, Yoann, Souriau, Laurent, Tsvetanova, Diana, Sankaran, Kiroubanand, Donadio, Gabriele L., Crotti, Davide, Van Beek, Simon, Rao, Siddharth, Goux, Ludovic, Kar, Gouri S., Furnemont, Arnaud
Published in IEEE transactions on magnetics (01.07.2016)
Published in IEEE transactions on magnetics (01.07.2016)
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Journal Article
Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Lee, Kookjin, Ji, Hyunjin, Kim, Yanghee, Kaczer, Ben, Lee, Hyebin, Ahn, Jae‐Pyoung, Choi, Junhee, Grill, Alexander, Panarella, Luca, Smets, Quentin, Verreck, Devin, Van Beek, Simon, Chasin, Adrian, Linten, Dimitri, Na, Junhong, Lee, Jae Woo, De Wolf, Ingrid, Kim, Gyu‐Tae
Published in Advanced materials interfaces (01.03.2022)
Published in Advanced materials interfaces (01.03.2022)
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Journal Article
Thermal stability analysis and modelling of advanced perpendicular magnetic tunnel junctions
Van Beek, Simon, Martens, Koen, Roussel, Philippe, Wu, Yueh Chang, Kim, Woojin, Rao, Siddharth, Swerts, Johan, Crotti, Davide, Linten, Dimitri, Kar, Gouri Sankar, Groeseneken, Guido
Published in AIP advances (01.05.2018)
Published in AIP advances (01.05.2018)
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Journal Article
Impact of SOT & STT stress on MTJ degradation in SOT-MRAM
Van Beek, Simon, Kateel, Vaishnavi, Cai, Kaiming, Jossart, Nico, Rao, Siddharth, Couet, Sebastien
Published in 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers) (01.05.2023)
Published in 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers) (01.05.2023)
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Conference Proceeding
A multi-energy level agnostic approach for defect generation during TDDB stress
Vici, Andrea, Degraeve, Robin, Kaczer, Ben, Franco, Jacopo, Van Beek, Simon, De Wolf, Ingrid
Published in Solid-state electronics (01.07.2022)
Published in Solid-state electronics (01.07.2022)
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Journal Article
A multi-energy level agnostic simulation approach to defect generation
Vici, Andrea, Degraeve, Robin, Kaczer, Ben, Franco, Jacopo, Van Beek, Simon, De Wolf, Ingrid
Published in Solid-state electronics (01.10.2021)
Published in Solid-state electronics (01.10.2021)
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Journal Article
J SW of 5.5 MA/cm 2 and RA of 5.2-Ω · μm 2 STT-MRAM Technology for LLC Application
Sakhare, Sushil, Rao, Siddharth, Perumkunnil, Manu, Couet, Sebastien, Crotti, Davide, Van Beek, Simon, Furnemont, Arnaud, Catthoor, Francky, Kar, Gouri Sankar
Published in IEEE transactions on electron devices (01.09.2020)
Published in IEEE transactions on electron devices (01.09.2020)
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Journal Article
JSW of 5.5 MA/cm² and RA of 5.2-Ω · μm² STT-MRAM Technology for LLC Application
Sakhare, Sushil, Rao, Siddharth, Perumkunnil, Manu, Couet, Sebastien, Crotti, Davide, Van Beek, Simon, Furnemont, Arnaud, Catthoor, Francky, Kar, Gouri Sankar
Published in IEEE transactions on electron devices (07.08.2020)
Published in IEEE transactions on electron devices (07.08.2020)
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Journal Article
J SWof 5.5 MA/cm2 and RA of 5.2-Ω · μm2 STT-MRAM Technology for LLC Application
Sakhare, Sushil, Rao, Siddharth, Perumkunnil, Manu, Couet, Sebastien, Crotti, Davide, Simon Van Beek, Furnemont, Arnaud, Catthoor, Francky, Kar, Gouri Sankar
Published in IEEE transactions on electron devices (01.01.2020)
Published in IEEE transactions on electron devices (01.01.2020)
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Journal Article
Modeling and Understanding the Compact Performance of h‐BN Dual‐Gated ReS 2 Transistor
Lee, Kookjin, Choi, Junhee, Kaczer, Ben, Grill, Alexander, Lee, Jae Woo, Van Beek, Simon, Bury, Erik, Diaz‐Fortuny, Javier, Chasin, Adrian, Lee, Jaewoo, Chun, Jungu, Shin, Dong Hoon, Cho, Hyeran, Lee, Sang Wook, Kim, Gyu‐Tae
Published in Advanced functional materials (01.06.2021)
Published in Advanced functional materials (01.06.2021)
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Journal Article
MTJ degradation in SOT-MRAM by self-heating-induced diffusion
Van Beek, Simon, Cai, Kaiming, Rao, Siddharth, Jayakumar, Ganesh, Couet, Sebastien, Jossart, Nico, Chasin, Adrian, Kar, Gouri Sankar
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
Spin-torque-driven MTJs with extended free layer for logic applications
Raymenants, Eline, Vaysset, Adrien, Wan, Danny, Swerts, Johan, Van Beek, Simon, Zografos, Odysseas, Nikonov, Dmitri E, Manipatruni, Sasikanth, Young, Ian A, Mocuta, Dan, Radu, Iuliana P, Heyns, Marc, Manfrini, Mauricio
Published in Journal of physics. D, Applied physics (11.07.2018)
Published in Journal of physics. D, Applied physics (11.07.2018)
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Journal Article
Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit
Van Beek, Simon, Rousse, Philippe, O'Sullivan, Barry, Degraeve, Robin, Cosemans, Stefan, Linten, Dimitri, Kar, Gouri Sankar
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
Published in 2018 48th European Solid-State Device Research Conference (ESSDERC) (01.09.2018)
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Conference Proceeding
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon, Rao, Siddharth, Kundu, Shreya, Kim, Woojin, O'Sullivan, Barry J., Cosemans, Stefan, Yasin, Farukh, Carpenter, Robert, Couet, Sebastien, Sharifi, Shamin H., Jossart, Nico, Crotti, Davide, Kar, Gouri
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
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Conference Proceeding
Cyclic Thermal Effects on Devices of Two‐Dimensional Layered Semiconducting Materials
Kim, Yeonsu, Kaczer, Ben, Verreck, Devin, Grill, Alexander, Kim, Doyoon, Song, Jaeick, Diaz‐Fortuny, Javier, Vici, Andrea, Park, Jongseon, Van Beek, Simon, Simicic, Marko, Bury, Erik, Chasin, Adrian, Linten, Dimitri, Lee, Jaewoo, Chun, Jungu, Kim, Seongji, Seo, Beumgeun, Choi, Junhee, Shim, Joon Hyung, Lee, Kookjin, Kim, Gyu‐Tae
Published in Advanced electronic materials (01.09.2021)
Published in Advanced electronic materials (01.09.2021)
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Journal Article
Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs
Van Beek, Simon, O'Sullivan, Barry J., Couet, Sebastien, Crotti, Davide, Linten, Dimitri, Kar, Gouri S.
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Ultrafast RVS as an Efficient Method to Measure Oxide Breakdown in the EOS and ESD Time Domain
Van Beek, Simon, Simicic, Marko, Franco, Jacopo, Chen, Shih-Hung, Linten, Dimitri
Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
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Published in 2020 42nd Annual EOS/ESD Symposium (EOS/ESD) (13.09.2020)
Conference Proceeding