CoSi2 ultra-thin layer formation kinetics and texture from X-ray diffraction
Delattre, R., Simola, R., Rivero, C., Serradeil, V., Perrin-Pellegrino, C., Thomas, O.
Published in Thin solid films (31.08.2013)
Published in Thin solid films (31.08.2013)
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Journal Article
Conference Proceeding
Decreasing reaction rate at the end of silicidation: In-situ CoSi2 XRD study and modeling
Delattre, R., Simola, R., Rivero, C., Serradeil, V., Perrin-Pellegrino, C., Thomas, O.
Published in Microelectronic engineering (01.06.2013)
Published in Microelectronic engineering (01.06.2013)
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Journal Article
Conference Proceeding
Push the flash floating gate memories toward the future low energy application
Della Marca, V., Just, G., Regnier, A., Ogier, J.-L., Simola, R., Niel, S., Postel-Pellerin, J., Lalande, F., Masoero, L., Molas, G.
Published in Solid-state electronics (01.01.2013)
Published in Solid-state electronics (01.01.2013)
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Journal Article
Advanced TCAD Simulation of Tunnel Oxide Degradation for EEPROM Applications
Matteo, F., Simola, R., Postel-Pellerin, J., Coulie, K.
Published in 2022 IEEE 4th International Conference on Dielectrics (ICD) (03.07.2022)
Published in 2022 IEEE 4th International Conference on Dielectrics (ICD) (03.07.2022)
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Conference Proceeding
1T-NOR Flash memory after endurance degradation: An advanced TCAD simulation
Matteo, F., Simola, R., Postel-Pellerin, J., Coulié, K.
Published in Microelectronics and reliability (01.11.2022)
Published in Microelectronics and reliability (01.11.2022)
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Journal Article
Decreasing reaction rate at the end of silicidation: In-situ CoSi sub(2) XRD study and modeling
Delattre, R, Simola, R, Rivero, C, Serradeil, V, Perrin-Pellegrino, C, Thomas, O
Published in Microelectronic engineering (01.06.2013)
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Published in Microelectronic engineering (01.06.2013)
Journal Article
In-situ study and modeling of the decreasing reaction rate at the end of CoSi2 formation
Delattre, R., Simola, R., Rivero, C., Serradeil, V., Perrin-Pellegrino, C., Thomas, O.
Published in 2011 IEEE International Interconnect Technology Conference (01.05.2011)
Published in 2011 IEEE International Interconnect Technology Conference (01.05.2011)
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Conference Proceeding
Experimental study to push the Flash floating gate memories toward low energy applications
Marca, V. Della, Regnier, A., Ogier, J.-L., Simola, R., Niel, S., Postel-Pellerin, J., Lalande, F., Molas, G.
Published in 2011 International Semiconductor Device Research Symposium (ISDRS) (01.12.2011)
Published in 2011 International Semiconductor Device Research Symposium (ISDRS) (01.12.2011)
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Conference Proceeding