by SIEW, Y. K, SARKAR, G, HU, X, HUI, J, SEE, A, CHUA, C. T
Published in Journal of the Electrochemical Society (2000)

by Vanstreels, K., Czarnecki, P., Kirimura, T., Siew, Y. K., De Wolf, I., Bömmels, J., Tőkei, Zs, Croes, K.
Published in Journal of applied physics (21.02.2014)

by SIEW, Y. K, SARKAR, G, HU, X, LEE, L. P, CHAN, L, SEE, A
Published in Journal of the Electrochemical Society (2001)

by Croes, K, Lofrano, M, Wilson, C J, Carbonell, L, Siew, Y K, Beyer, G P, Tokei, Z
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Subramanian, S., Hosseini, M., Chiarella, T., Sarkar, S., Schuddinck, P., Chan, B. T., Radisic, D., Mannaert, G., Hikavyy, A., Rosseel, E., Sebaai, F., Peter, A., Hopf, T., Morin, P., Wang, S., Devriendt, K., Batuk, D., Martinez, G. T., Veloso, A., Litta, E. Dentoni, Baudot, S., Siew, Y. K., Zhou, X., Briggs, B., Capogreco, E., Hung, J., Koret, R., Spessot, A., Ryckaert, J., Demuynck, S., Horiguchi, N., Boemmels, J.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Capogreco, E., Arimura, H., Witters, L., Vohra, A., Porret, C., Loo, R., De Keersgieter, A., Dupuy, E., Marinov, D., Hikavyy, A., Sebaai, F., Mannaert, G., Ragnarsson, L.-A., Siew, Y. K., Vrancken, C., Opdebeeck, A., Mitard, J., Langer, R., Sanchez, E. Altamirano, Holstetns, F., Demuynck, S., Barla, K., De Heyn, V., Mocuta, D., Collaert, N., Horiguchi, N.
Published in 2019 Symposium on VLSI Technology (01.06.2019)

by Croes, K, Demuynck, S, Siew, Y K, Pantouvaki, M, Wilson, C J, Heylen, N, Beyer, G P, Toekei, Z
Published in Microelectronic engineering (01.06.2013)

by Siew, Yong Kong, Stucchi, Michele, Versluijs, Janko, Roussel, Philippe, Kunnen, Eddy, Pantouvaki, Marianna, Beyer, Gerald P., Tokei, Zsolt
Published in Microelectronic engineering (01.12.2013)

by Yunlong Li, Croes, K., Kirimura, T., Siew, Y. K., Tokei, Z.
Published in 2012 IEEE International Reliability Physics Symposium (IRPS) (01.04.2012)

by Chen, F., Ungar, F., Fischer, A.H., Gill, J., Chinthakindi, A., Goebel, T., Shinosky, M., Coolbaugh, D., Ramachandran, V., Siew, Y.K., Kaltalioglu, E., Kim, S.O., Park, K.
Published in 2006 IEEE International Reliability Physics Symposium Proceedings (01.03.2006)

by Siew, Y. K., Jourdan, N., Ciofi, I., Croes, K., Wilson, C. J., Tang, B. J., Demuynck, S., Wu, Z., Ai, H., Cellier, D., Cockburn, A., Bömmels, J., Tökei, Zs
Published in IEEE International Interconnect Technology Conference (01.05.2014)

by Siew, Y. K., Jourdan, N., Barbarin, Y., Machillot, J., Demuynck, S., Croes, K., Tseng, J., Ai, H., Tang, J., Naik, M., Wang, P., Narasimhan, M., Abraham, M., Cockburn, A., Bommels, J., Tokei, Zs
Published in 2013 IEEE International Interconnect Technology Conference - IITC (01.06.2013)

by Kirimura, T., Croes, K., Siew, Y. K., Vanstreels, K., Czarnecki, P., Ei-Mekki, Z., van der Veen, M. H., Dictus, D., Yoon, A., Kolics, A., Bommcls, J., Tokei, Zs
Published in 2013 IEEE International Interconnect Technology Conference - IITC (01.06.2013)

by Croes, K., Demuynck, S., Siew, Y. K., Wilson, C. J., Heylen, N., Beyer, G. P., Tokei, Z.
Published in 2011 IEEE International Interconnect Technology Conference (01.05.2011)

by Steegen, A., Mo, R., Mann, R., Sun, M.-C., Eller, M., Leake, G., Vietzke, D., Tilke, A., Guarin, F., Fischer, A., Pompl, T., Massey, G., Vayshenker, A., Tan, W.L., Ebert, A., Lin, W., Gao, W., Lian, J., Kim, J.-P., Wrschka, P., Yang, J.-H., Ajmera, A., Knoefler, R., Teh, Y.-W., Jamin, F., Park, J.E., Hooper, K., Griffin, C., Nguyen, P., Klee, V., Ku, V., Baiocco, C., Johnson, G., Tai, L., Benedict, J., Scheer, S., Zhuang, H., Ramanchandran, V., Matusiewicz, G., Lin, Y.-H., Siew, Y.K., Zhang, F., Leong, L.S., Liew, S.L., Park, K.C., Lee, K.-W., Hong, D.H., Choi, S.-M., Kaltalioglu, E., Kim, S.O., Naujok, M., Sherony, M., Cowley, A., Thomas, A., Sudijohno, J., Schiml, T., Ku, J.-H., Yang, I.
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)

by Tan, J.B., Seet, C.S., Zhang, H., Lim, S.K., Chua, S.T., Ismail, Z., Seah, B.M., Ee, P.Y., Vigar, D., Hsia, L.C., Zhang, B.C., Tang, T.J., Perera, C., Lim, Y.K., Siew, Y.K., Ee, Y.C., Lu, W., Liu, H.
Published in 2006 International Interconnect Technology Conference (2006)

by LIM KUI Y.,ONG SIEW K
Year of Publication 08.08.2007

by Lee, T.J., Lim, Y.K., Zhang, F., Tan, D., Siew, Y.K., Perera, C., Bu, X.M., Chong, D., Vigar, D., Sun, S.C.
Published in Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004 (2004)

by Wu Ping Liu, Juan Boon Tan, Wei Lu, Shyam Pal, Yong Kong Siew, Hai Cong, Bei Chao Zhang, Xian Bin Wang, Fan Zhang, Liang Choo Hsia
Published in IEEE VLSI-TSA International Symposium on VLSI Technology, 2005. (VLSI-TSA-Tech) (2005)